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to 10 of 6616 (Search time: 0.156 seconds).
Optimization of Dual-workfunction Line Tunnel Field-effect Transistor with Island Source Junction
Yun, Chaewon;
Kim, Sangwan;
Cho, Seongjae;
Cho, Il Hwan;
Kim, Hyunwoo;
Kim, Jang Hyun
;
Kim, Garam
2023-08-01
Journal of Semiconductor Technology and Science, Vol.23, pp.207-214
Institute of Electronics Engineers of Korea
Impact of Work-Function Variation in Ferroelectric Field-Effect Transistor
oa mark
Yeon Jung, Su;
Kim, Hyunwoo;
Lee, Jongmin
;
Hyun Kim, Jang
2024-01-01
IEEE Journal of the Electron Devices Society, Vol.12, pp.779-784
Institute of Electrical and Electronics Engineers Inc.
HiMAQ: Hierarchical multi-agent Q-learning-based throughput and fairness improvement for UAV-Aided IoT networks
Kim, Eunjin;
Kim, Junsu;
Kim, Jae Hyun
;
Lee, Howon
2024-03-01
Journal of Network and Computer Applications, Vol.223
Academic Press
Development of an augmented reality tour guide for a cultural heritage site
Koo, Seungbum;
Kim, Jinyoung
;
Kim, Changhyuk;
Kim, Jeeyeop;
Cha, Hee Sung
2019-11-01
Journal on Computing and Cultural Heritage, Vol.12
Association for Computing Machinery
Kinetic model generation from triangular mesh models
Park, Ji M.;
Ko, Min S.;
Lee, Woong G.;
Park, Sang C.
2020-01-01
Computer-Aided Design and Applications, Vol.17, pp.1130-1142
CAD Solutions, LLC
Rigorous study on hump phenomena in surrounding channel nanowire (SCNW) tunnel field-effect transistor (TFET)
oa mark
Lee, Seung Hyun;
Park, Jeong Uk;
Kim, Garam;
Jee, Dong Woo
;
Kim, Jang Hyun
;
Kim, Sangwan
2020-05-01
Applied Sciences (Switzerland), Vol.10
MDPI AG
Impact of Self-Heating Effect on DC and AC Performance of FD-SOI CMOS Inverter
oa mark
Hee Lee, Kang;
Kim, Mincheol;
Lee, Jongmin
;
Kim, Jang Hyun
2025-01-01
IEEE Journal of the Electron Devices Society, Vol.13, pp.41-48
Institute of Electrical and Electronics Engineers Inc.
Improvement of Thermal Characteristics and On-Current in Vertically Stacked Nanosheet FET by Parasitic Channel Height Engineering
oa mark
Song, Young Suh;
Kim, Hyunwoo;
Kim, Jang Hyun
2024-01-01
IEEE Access, Vol.12, pp.105878-105886
Institute of Electrical and Electronics Engineers Inc.
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