Showing results 1 to 20 of 104
Investigation of ferro-resistive switching mechanisms in TiN/Hf0.5Zr0.5O2/WOx/W ferroelectric tunnel junctions with the interface layer effect- Lee, Suk Hyun;
- Park, Han Sol;
- Shin, Seong Jae;
- Lee, In Soo;
- Ryoo, Seung Kyu;
- Byun, Seungyong;
- Kim, Kyung Do;
- Moon, Taehwan;
- Hwang, Cheol Seong
- 2024-12-01
- Applied Physics Reviews, Vol.11
- American Institute of Physics
Network of artificial olfactory receptors for spatiotemporal monitoring of toxic gas- Baek, Yongmin;
- Bae, Byungjoon;
- Yang, Jeongyong;
- Cho, Wonjun;
- Sim, Inbo;
- Yoo, Geonwook;
- Chung, Seokhyun;
- Heo, Junseok;
- Lee, Kyusang
- 2024-10-18
- Science Advances, Vol.10
- American Association for the Advancement of Science
Leveraging volatile memristors in neuromorphic computing: from materials to system implementation- Moon, Taehwan;
- Soh, Keunho;
- Kim, Jong Sung;
- Kim, Ji Eun;
- Chun, Suk Yeop;
- Cho, Kyungjune;
- Yang, J. Joshua;
- Yoon, Jung Ho
- 2024-08-20
- Materials Horizons, Vol.11, pp.4840-4866
- Royal Society of Chemistry
Direct Observation for Distinct Behaviors of Gamma-Ray Irradiation-Induced Subgap Density-of-States in Amorphous InGaZnO TFTs by Multiple-Wavelength Light Sourceoa mark- Yoo, Jaewook;
- Jo, Hyeun Seung;
- Jeon, Seung Bae;
- Moon, Taehwan;
- Lee, Hongseung;
- Lim, Seongbin;
- Song, Hyeonjun;
- Lee, Binhyeong;
- Yoon, Soon Joo;
- Kim, Soyeon;
et al
- 2024-08-01
- Advanced Electronic Materials, Vol.10
- John Wiley and Sons Inc
Photon-pair generation using inverse-designed thin-film lithium niobate mode convertersoa mark- Kwon, Kiwon;
- Heo, Hyungjun;
- Lee, Dongjin;
- Kim, Hyeongpin;
- Jang, Hyeong Soon;
- Shin, Woncheol;
- Lim, Hyang Tag;
- Kim, Yong Su;
- Han, Sang Wook;
- Kim, Sangin;
et al
- 2024-05-01
- APL Photonics, Vol.9
- American Institute of Physics
Review of Material Properties of Oxide Semiconductor Thin Films Grown by Atomic Layer Deposition for Next-Generation 3D Dynamic Random-Access Memory Devices- Choi, Ae Rim;
- Lim, Dong Hyun;
- Shin, So Yeon;
- Kang, Hye Joo;
- Kim, Dohee;
- Kim, Ja Yong;
- Ahn, Youngbae;
- Ryu, Seung Wook;
- Oh, Il Kwon
- 2024-03-12
- Chemistry of Materials, Vol.36, pp.2194-2219
- American Chemical Society
First Demonstration of Thermally Stable Zr:HfO2Ferroelectrics via Inserting AlN Interlayer- Lee, Sangmok;
- Kim, Giuk;
- Lee, Sangho;
- Shin, Hunbeom;
- Lim, Youngjin;
- Kim, Kang;
- Kim, Do Hyung;
- Oh, Il Kwon;
- Ko Park, Sang Hee;
- Ahn, Jinho;
et al
- 2024-01-01
- IEEE Electron Device Letters, Vol.45, pp.1578-1581
- Institute of Electrical and Electronics Engineers Inc.
Experimental Analysis on the Interaction Between Interface Trap Charges and Polarization on the Memory Window of Metal-Ferroelectric-Insulator-Si (MFIS) FeFET- Kim, Giuk;
- Choi, Hyojun;
- Lee, Sangho;
- Shin, Hunbeom;
- Lee, Sangmok;
- Nam, Yunseok;
- Kang, Hyunjun;
- Shin, Seokjoong;
- Kim, Hoon;
- Lim, Youngjin;
et al
- 2024-01-01
- IEEE Transactions on Electron Devices, Vol.71, pp.6627-6632
- Institute of Electrical and Electronics Engineers Inc.
