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A New AMHS Testbed for Semiconductor Manufacturing
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Publication Year
2022-01-01
Journal
Proceedings - Winter Simulation Conference
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
Proceedings - Winter Simulation Conference, Vol.2022-December, pp.3318-3325
Mesh Keyword
A: semiconductorsAutomated material handling systemsModeling featuresSemiconductor fab simulationSemiconductor manufacturingSimulation modelSystem simulation modelsTest EnvironmentTest operationsTransport time
All Science Classification Codes (ASJC)
SoftwareModeling and SimulationComputer Science Applications
Abstract
This paper proposes a new dataset of semiconductor fab simulation models. As the size and complexity of FABs increase, it is essential to operate automated material handling systems (AMHS) efficiently. Although the latest testbed, SMT2020 (Semiconductor Manufacturing Testbed2020), is realistic in scale and complexity for modern semiconductor FABs, there is a lack of details on AMHSs. Therefore, we developed details for an AMHS simulation model with sufficient scale and complexity. A full description of the simulation model features is provided, compared with an assumption about transport times in SMT2020. This study aims to provide a test environment for researchers to test operation and logistics in a semiconductor FAB. The prototype of the proposed testbed is open to public use.
ISSN
0891-7736
Language
eng
URI
https://aurora.ajou.ac.kr/handle/2018.oak/36842
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85147455828&origin=inward
DOI
https://doi.org/10.1109/wsc57314.2022.10015476
Type
Conference
Funding
This work was supported by the National Research Foundation (NFR-2020R1A2C1004544) grant by the Korean government (MSIT); and the Institute for Information and Communications Technology Promotion (IITP-2021000292) grant funded by the Korean government (MSIT).
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Park, SangChul박상철
Department of Industrial Engineering
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