Citation Export
DC Field | Value | Language |
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dc.contributor.author | Lee, Kwanwoo | - |
dc.contributor.author | Song, Siyong | - |
dc.contributor.author | Chang, Daesoon | - |
dc.contributor.author | Park, Sangchul | - |
dc.date.issued | 2022-01-01 | - |
dc.identifier.issn | 0891-7736 | - |
dc.identifier.uri | https://aurora.ajou.ac.kr/handle/2018.oak/36842 | - |
dc.identifier.uri | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85147455828&origin=inward | - |
dc.description.abstract | This paper proposes a new dataset of semiconductor fab simulation models. As the size and complexity of FABs increase, it is essential to operate automated material handling systems (AMHS) efficiently. Although the latest testbed, SMT2020 (Semiconductor Manufacturing Testbed2020), is realistic in scale and complexity for modern semiconductor FABs, there is a lack of details on AMHSs. Therefore, we developed details for an AMHS simulation model with sufficient scale and complexity. A full description of the simulation model features is provided, compared with an assumption about transport times in SMT2020. This study aims to provide a test environment for researchers to test operation and logistics in a semiconductor FAB. The prototype of the proposed testbed is open to public use. | - |
dc.description.sponsorship | This work was supported by the National Research Foundation (NFR-2020R1A2C1004544) grant by the Korean government (MSIT); and the Institute for Information and Communications Technology Promotion (IITP-2021000292) grant funded by the Korean government (MSIT). | - |
dc.language.iso | eng | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.subject.mesh | A: semiconductors | - |
dc.subject.mesh | Automated material handling systems | - |
dc.subject.mesh | Modeling features | - |
dc.subject.mesh | Semiconductor fab simulation | - |
dc.subject.mesh | Semiconductor manufacturing | - |
dc.subject.mesh | Simulation model | - |
dc.subject.mesh | System simulation models | - |
dc.subject.mesh | Test Environment | - |
dc.subject.mesh | Test operations | - |
dc.subject.mesh | Transport time | - |
dc.title | A New AMHS Testbed for Semiconductor Manufacturing | - |
dc.type | Conference | - |
dc.citation.conferenceDate | 2022.12.11. ~ 2022.12.14. | - |
dc.citation.conferenceName | 2022 Winter Simulation Conference, WSC 2022 | - |
dc.citation.edition | Proceedings of the 2022 Winter Simulation Conference, WSC 2022 | - |
dc.citation.endPage | 3325 | - |
dc.citation.startPage | 3318 | - |
dc.citation.title | Proceedings - Winter Simulation Conference | - |
dc.citation.volume | 2022-December | - |
dc.identifier.bibliographicCitation | Proceedings - Winter Simulation Conference, Vol.2022-December, pp.3318-3325 | - |
dc.identifier.doi | 10.1109/wsc57314.2022.10015476 | - |
dc.identifier.scopusid | 2-s2.0-85147455828 | - |
dc.type.other | Conference Paper | - |
dc.description.isoa | false | - |
dc.subject.subarea | Software | - |
dc.subject.subarea | Modeling and Simulation | - |
dc.subject.subarea | Computer Science Applications | - |
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