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Showing results 1 to 10 of 5432 (Search time: 0.0 seconds).

Optimization of Dual-workfunction Line Tunnel Field-effect Transistor with Island Source Junction
  • Yun, Chaewon;
  • Kim, Sangwan;
  • Cho, Seongjae;
  • Cho, Il Hwan;
  • Kim, Hyunwoo;
  • Kim, Jang Hyun;
  • Kim, Garam
  • 2023-08-01
  • Journal of Semiconductor Technology and Science, Vol.23, pp.207-214
  • Institute of Electronics Engineers of Korea
Effects of Material and Doping Profile Engineering of Source Junction on Line Tunneling FET Operations
  • 2023-08-01
  • Journal of Semiconductor Technology and Science, Vol.23, pp.228-235
  • Institute of Electronics Engineers of Korea
Demonstration of a Frequency Doubler Using a Tunnel Field-Effect Transistor with Dual Pocket Dopingoa mark
  • 2023-12-01
  • Electronics (Switzerland), Vol.12
  • Multidisciplinary Digital Publishing Institute (MDPI)
Rigorous study on hump phenomena in surrounding channel nanowire (SCNW) tunnel field-effect transistor (TFET)oa mark
  • 2020-05-01
  • Applied Sciences (Switzerland), Vol.10
  • MDPI AG
Frequency doubler utilizing hetero gate dielectric tunnel field-effect transistor
  • 2024-04-01
  • Physica Scripta, Vol.99
  • Institute of Physics
Work-Function Variation and Delay Analysis in NAND and NOR Circuits using Gate Insulator Stack-based Dopingless Tunnel Field-effect Transistors
  • 2024-12-01
  • Journal of Semiconductor Technology and Science, Vol.24, pp.557-564
  • Institute of Electronics Engineers of Korea
Analysis and Prediction of Nanowire TFET’s Work Function Variation
  • 2024-04-01
  • Journal of Semiconductor Technology and Science, Vol.24, pp.96-104
  • Institute of Electronics Engineers of Korea
Fabrication of a Field-Effect Transistor Based on 2D Novel Ternary Chalcogenide PdPS
  • Lee, Bom;
  • Jeong, Byung Joo;
  • Choi, Kyung Hwan;
  • Cho, Sooheon;
  • Jeon, Jiho;
  • Kang, Jinsu;
  • Zhang, Xiaojie;
  • Bang, Hyeon Seok;
  • Oh, Hyung Suk;
  • Lee, Jae Hyun;
  • Yu, Hak Ki;
  • Choi, Jae Young
  • 2023-09-13
  • ACS Applied Materials and Interfaces, Vol.15, pp.42891-42899
  • American Chemical Society
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