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Showing results 1 to 10 of 4312 (Search time: 0.016 seconds).

Analysis of thermal effects according to channel and drain contact metal distanceoa mark
  • 2025-01-01
  • Case Studies in Thermal Engineering, Vol.65
  • Elsevier Ltd
Direct growth of graphene on a SiGe alloy surface by chemical vapor deposition
  • Moon, Ji Yun;
  • Kim, Seung Il;
  • Heo, Keun;
  • Lee, Jae Hyun
  • 2019-04-01
  • Journal of Semiconductor Technology and Science, Vol.19, pp.190-195
  • Institute of Electronics Engineers of Korea
Topological van der Waals Contact for Two-Dimensional Semiconductors
  • Ghods, Soheil;
  • Lee, Hyunjin;
  • Choi, Jun Hui;
  • Moon, Ji Yun;
  • Kim, Sein;
  • Kim, Seung Il;
  • Kwun, Hyung Jun;
  • Josline, Mukkath Joseph;
  • Kim, Chan Young;
  • Hyun, Sang Hwa;
  • Kim, Sang Won;
  • Son, Seok Kyun;
  • Lee, Taehun;
  • Lee, Yoon Kyeung;
  • Heo, Keun;
  • Novoselov, Kostya S.;
  • Lee, Jae Hyun
  • 2024-01-01
  • ACS Nano
  • American Chemical Society
An Eco-Friendly, CMOS-Compatible Transfer Process for Large-Scale CVD-Graphene
  • Moon, Ji Yun;
  • Kim, Seung Il;
  • Son, Seok Kyun;
  • Kang, Seog Gyun;
  • Lim, Jae Young;
  • Lee, Dong Kyu;
  • Ahn, Byungmin;
  • Whang, Dongmok;
  • Yu, Hak Ki;
  • Lee, Jae Hyun
  • 2019-07-09
  • Advanced Materials Interfaces, Vol.6
  • Wiley-VCH Verlag
A comparative study of charge trapping effect in p-type MoTe2 and WSe2 FETs using pulsed current-voltage measurements
  • Yang, Jeong Yong;
  • Lee, Chan Ho;
  • Oh, Young Taek;
  • Ma, Jiyeon;
  • Heo, Junseok;
  • Yoo, Geonwook
  • 2021-01-01
  • Japanese Journal of Applied Physics, Vol.60
  • IOP Publishing Ltd
Graphene on Group-IV Elementary Semiconductors: The Direct Growth Approach and Its Applications
  • Lee, Jae Hyun;
  • Kang, Seog Gyun;
  • Jang, Hyeon Sik;
  • Moon, Ji Yun;
  • Whang, Dongmok
  • 2019-08-01
  • Advanced Materials, Vol.31
  • Wiley-VCH Verlag
The Significance of an In Situ ALD Al2O3 Stacked Structure for p-Type SnO TFT Performance and Monolithic All-ALD-Channel CMOS Inverter Applicationsoa mark
  • 2023-04-01
  • Advanced Electronic Materials, Vol.9
  • John Wiley and Sons Inc
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