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ICLTR: A Input-split Inverters and C-elements based Low-Cost Latch with Triple-Node-Upset Recovery
  • Zhang, Jiajia ;
  • Li, Zhenmin ;
  • Shan, Gaoyang ;
  • Song, Jie ;
  • Guo, Xing ;
  • Wen, Xiaoqing
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Publication Year
2024-01-01
Journal
Proceedings - ITC-Asia 2024: 8th IEEE International Test Conference in Asia
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
Proceedings - ITC-Asia 2024: 8th IEEE International Test Conference in Asia
Keyword
latch reliabilityRadiation hardeningself-recoverysoft errortriple-node-upset
Mesh Keyword
C-elementElement-basedLatch reliabilityLow-costsPowerSelf-recoverySemiconductor technologySoft errorTransmission delaysTriple-node-upset
All Science Classification Codes (ASJC)
Computer Vision and Pattern RecognitionHardware and ArchitectureInformation Systems and ManagementElectrical and Electronic EngineeringSafety, Risk, Reliability and QualityInstrumentation
Abstract
As the semiconductor technology continues to advance, integrated circuits (ICs) are becoming increasingly sensitive to soft errors, e.g., double-node upsets (DNUs) and triplenode upsets (TNUs), induced by harsh radiation. In this paper, a low-cost latch design, namely ICLTR, using input-split inverters (ISIs) and C-elements to provide complete TNU recovery, is proposed. ICLTR consists of seven ISIs, seven 2-input C-elements and a clock-gated inverter, and all these elements are interlocked. Simulation results show the complete TNU recovery for ICLTR. The simulation results also show that ICLTR can save 59.5% of the transmission delay, 36.1% of the power consumption and 81.6% of the delay-area-power product (DAPP) on average when compared with the same type of TNU recovery latch designs.
Language
eng
URI
https://aurora.ajou.ac.kr/handle/2018.oak/37134
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85204791545&origin=inward
DOI
https://doi.org/10.1109/itc-asia62534.2024.10661358
Journal URL
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=10661305
Type
Conference
Funding
This work was supported in part by the NSFC of China (Grant 62027815).
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SHAN GAOYANGSHAN, GAOYANG
Department of Software and Computer Engineering
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