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SHRCO: Design of an SRAM with High Reliability and Cost Optimization for Safety-Critical Applications
  • Chang, Yang ;
  • Liu, Guangzhu ;
  • Ullah, Inam ;
  • Shan, Gaoyang ;
  • Wen, Xiaoqing ;
  • Yan, Aibin
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Publication Year
2024-01-01
Journal
Proceedings - ITC-Asia 2024: 8th IEEE International Test Conference in Asia
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
Proceedings - ITC-Asia 2024: 8th IEEE International Test Conference in Asia
Keyword
circuit reliabilitydouble-nodeupsetself-recoverysoft errorSRAM
Mesh Keyword
Circuit reliabilityDouble-nodeupsetHigh costsHigh reliabilityNode pairsRadiation-hardenedRecoverabilitySelf-recoverySoft errorSRAM Cell
All Science Classification Codes (ASJC)
Computer Vision and Pattern RecognitionHardware and ArchitectureInformation Systems and ManagementElectrical and Electronic EngineeringSafety, Risk, Reliability and QualityInstrumentation
Abstract
This paper proposes a novel radiation-hardened high-reliability SRAM cell, namely SHRCO, with 12 transistors for robust value storage as well as 6 transistors for parallel access operations. Using separated and error-interceptive feedback paths, the proposed cell has a complete self-recoverability from single-node upset (SNUs) at all single nodes and an excellent self-recoverability from double-node upsets (DNUs) at a part of node pairs. In addition, the proposed cell has superior access operation speed due to the inclusion of extra parallel access transistors. Simulation results show that the proposed cell has the largest number of node pairs that can self-recover from DNUs. Moreover, compared to the existing radiation-hardened SRAM cells, the proposed cell saves 28% of read time and 3% of write time on average.
Language
eng
URI
https://aurora.ajou.ac.kr/handle/2018.oak/37132
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85204795083&origin=inward
DOI
https://doi.org/10.1109/itc-asia62534.2024.10661340
Journal URL
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=10661305
Type
Conference
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SHAN GAOYANGSHAN, GAOYANG
Department of Software and Computer Engineering
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