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Queue Time Prediction Methodology in Semiconductor Fab
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Publication Year
2023-01-01
Journal
Proceedings - Winter Simulation Conference
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
Proceedings - Winter Simulation Conference, pp.2172-2181
Mesh Keyword
BlockingsImpact costsMulti-ProcessesPrediction methodologyQueue timeSemi-conductor fabricationSemiconductor fabsSimulation modelSingle processTime predictions
All Science Classification Codes (ASJC)
SoftwareModeling and SimulationComputer Science Applications
Abstract
This paper presents a methodology for predicting queue times in semiconductor fabrication, where numerous complex and costly pieces of equipment are utilized. Queue time, occurring between continuous single or multi-processes, is a crucial factor affecting the quality of wafers, which can significantly impact costs. While most semiconductor fabrications use queue time limits as a key dispatching factor, some wafers may still be scrapped or reworked. By predicting queue times, we can reduce unnecessary waste by blocking or re-dispatching wafers. Two approximations are proposed and compared based on accuracy and prediction time: a machine learning model trained using experimental results and a multi-resolution simulation model with varying fidelity levels. The simulation model is validated using the SMAT2022 data set.
ISSN
0891-7736
Language
eng
URI
https://aurora.ajou.ac.kr/handle/2018.oak/36990
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85185373781&origin=inward
DOI
https://doi.org/10.1109/wsc60868.2023.10408686
Type
Conference
Funding
This work was supported by the National Research Foundation (NRF-2020R1A2C1004544) grant by the Korean government (MSIT); the Institute for Information and Communications Technology Promotion (IITP-2021000292) grant by the Korean government (MSIT); and the Ministry of Trade, Industry & Energy (MOTIE, Korea) of the Republic of Korea (RS-2022-00155650).
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Park, SangChul Image
Park, SangChul박상철
Department of Industrial Engineering
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