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Enhancement-mode GaN HEMT utilizing ZAZ-structured multi-stack charge-trap layers
  • 2025-06-20
  • Journal of Alloys and Compounds, Vol.1033
  • Elsevier Ltd
Homogeneous ZrO2 gate dielectrics with intermediate ozone oxidation for improved interface stability and leakage suppression in Ge-based MOS devices
  • 2025-06-15
  • Materials Science in Semiconductor Processing, Vol.192
  • Elsevier Ltd
Area-Selective Atomic Layer Deposition on Homogeneous Substrate for Next-Generation Electronic Devices
  • Rhee, Min Jeong;
  • Won, Byoungjun;
  • Lim, Young Jin;
  • Song, Jeong Gyu;
  • Kim, Sunghyun;
  • Oh, Il Kwon
  • 2025-06-12
  • Advanced Science, Vol.12 No.22
  • John Wiley and Sons Inc
Exploring surface chemistry and electrical performance of zinc tin oxide thin films with controlling elemental composition grown by atomic layer deposition
  • Lim, Dong Hyun;
  • Choi, Ae Rim;
  • Ryu, Seung Wook;
  • Park, Kyung Won;
  • Choi, Ji Hye;
  • Oh, Il Kwon
  • 2025-06-01
  • Applied Surface Science Advances, Vol.27
  • Elsevier B.V.
Rapid cooling process-driven enhancement of an orthorhombic phase in ferroelectric HfZrOx of sub-3 nm ultrathin films by atomic layer depositionoa mark
  • Shin, So Yeon;
  • Yu, Yeon Je;
  • Choi, Ae Rim;
  • Kim, Dohee;
  • Kim, Ja Yong;
  • Ryu, Seung Wook;
  • Oh, Il Kwon
  • 2025-06-01
  • Applied Surface Science Advances, Vol.27
  • Elsevier B.V.
Broadband thin-film lithium niobate rapid adiabatic couplers enabling highly visible two-photon interference
  • Moon, Sunghyun;
  • Lee, Jinil;
  • Lee, Junhyung;
  • Koh, Youngseo;
  • Kim, Changhyun;
  • Jang, Hyeong Soon;
  • Kim, Sangin;
  • Han, Sang Wook;
  • Jung, Hojoong;
  • Kwon, Hyounghan
  • 2025-06-01
  • Photonics Research, Vol.13 No.6, pp.1579-1590
  • Optica Publishing Group (formerly OSA)
Strategic Design of A1–π–A2-Type Polymer Acceptors for Highly Sensitive Near-Infrared All-Polymer Photodetectors
  • Lee, Seok Woo;
  • Seo, Gyeong Uk;
  • Son, Ji Yeon;
  • Prayogo, Juan Anthony;
  • Whang, Dong Ryeol;
  • Lee, Ah Young;
  • Kim, Jae Hyun;
  • Seo, Mingi;
  • Lee, Dong Hyun;
  • Heo, Junseok;
et al
  • 2025-03-13
  • Advanced Optical Materials, Vol.13 No.8
  • John Wiley and Sons Inc
Role of a cyclopentadienyl ligand in Hf precursors using H2O or O3 as oxidant in atomic layer deposition
  • Song, Youngmin;
  • Kim, Hui Jin;
  • Lee, Soo Hyun;
  • Kwon, Sujin;
  • Shong, Bonggeun;
  • Oh, Il Kwon
  • 2025-03-01
  • Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol.43 No.2
  • AVS Science and Technology Society
On-chip quantum key distribution over field-deployed fiber using lithium niobate photonic circuit
  • Heo, Hyungjun;
  • Woo, Min Ki;
  • Park, Chang Hoon;
  • Jang, Hyeong Soon;
  • Hwang, Hyeon;
  • Lee, Hansuek;
  • Seo, Min Kyo;
  • Kim, Sangin;
  • Kwon, Hyounghan;
  • Jung, Hojoong;
et al
  • 2025-03-01
  • APL Photonics, Vol.10 No.3
  • American Institute of Physics
Fabrication of a 3D mode size converter for efficient edge coupling in photonic integrated circuits
  • Jang, Hyeong Soon;
  • Heo, Hyungjun;
  • Kim, Sangin;
  • Hwang, Hyeon;
  • Lee, Hansuek;
  • Seo, Min Kyo;
  • Kwon, Hyunghan;
  • Han, Sang Wook;
  • Jung, Hojoong
  • 2025-02-24
  • Optics Express, Vol.33 No.4, pp.6909-6917
  • Optica Publishing Group (formerly OSA)
Low-frequency noise and DC I-V characterization of gamma-ray irradiation-induced degradation and trap behaviors in a-IGZO TFTs
  • Lee, Hongseung;
  • Yoo, Jaewook;
  • Song, Hyeonjun;
  • Lee, Binhyeong;
  • Yoon, Soon Joo;
  • Lim, Seongbin;
  • Jeong, Jo Hak;
  • Kim, Soyeon;
  • Park, Minah;
  • Park, Seohyeon;
et al
  • 2025-02-10
  • Applied Physics Letters, Vol.126 No.6
  • American Institute of Physics
HfO2-based ferroelectric synaptic devices: challenges and engineering solutions
  • Kwon, Taegyu;
  • Choi, Hyeong Seok;
  • Lee, Dong Hyun;
  • Han, Dong Hee;
  • Cho, Yong Hyeon;
  • Jeon, Intak;
  • Jung, Chang Hwa;
  • Lim, Hanjin;
  • Moon, Taehwan;
  • Park, Min Hyuk
  • 2025-01-08
  • Chemical Communications, Vol.61 No.15, pp.3061-3080
  • Royal Society of Chemistry
Surface conduction and reduced electrical resistivity in ultrathin noncrystalline NbP semimetaloa mark
  • Khan, Asir Intisar;
  • Ramdas, Akash;
  • Lindgren, Emily;
  • Kim, Hyun Mi;
  • Won, Byoungjun;
  • Wu, Xiangjin;
  • Saraswat, Krishna;
  • Chen, Ching Tzu;
  • Suzuki, Yuri;
  • da Jornada, Felipe H.;
et al
  • 2025-01-03
  • Journal of Bio-X Research, Vol.387 No.6729, pp.62-67
  • American Association for the Advancement of Science
Thermal Characteristics Enhancement of Drain-Extended FinFETs for System on Chip Applications With Dual High-k Field Plates
  • 2025-01-01
  • IEEE Journal of the Electron Devices Society, Vol.13, pp.182-188
  • Institute of Electrical and Electronics Engineers Inc.
A Cost-Effective Per-Pin ALPG for High-Speed Memory Testing
  • 2025-01-01
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol.33 No.3, pp.867-871
  • Institute of Electrical and Electronics Engineers Inc.
Effective Parallel Redundancy Analysis Using GPU for Memory Repair
  • 2025-01-01
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol.33 No.2, pp.462-474
  • Institute of Electrical and Electronics Engineers Inc.
A New Pipelined Output Data Reducer of BOST for Improved Parallelism
  • 2025-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.44 No.2, pp.765-776
  • Institute of Electrical and Electronics Engineers Inc.
A Robust Test Architecture for Low-Power AI Accelerators
  • 2025-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.44 No.4, pp.1581-1594
  • Institute of Electrical and Electronics Engineers Inc.
Impact of Self-Heating Effect on DC and AC Performance of FD-SOI CMOS Inverter
  • 2025-01-01
  • IEEE Journal of the Electron Devices Society, Vol.13, pp.41-48
  • Institute of Electrical and Electronics Engineers Inc.
Multi-Stage Enhanced Diagnosis With Fault Candidate Reduction
  • 2025-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Institute of Electrical and Electronics Engineers Inc.
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