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Showing results 1 to 20 of 133

2×N twin-field quantum key distribution network configuration based on polarization, wavelength, and time division multiplexingoa mark
  • Park, Chang Hoon;
  • Woo, Min Ki;
  • Park, Byung Kwon;
  • Kim, Yong Su;
  • Baek, Hyeonjun;
  • Lee, Seung Woo;
  • Lim, Hyang Tag;
  • Jeon, Seung Woo;
  • Jung, Hojoong;
  • Kim, Sangin;
et al
  • 2022-12-01
  • npj Quantum Information, Vol.8 No.1
  • Nature Research
A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis Method for HBM
  • Yoon, Joonsik;
  • Lee, Hayoung;
  • Moon, Youngki;
  • Shin, Seung Ho;
  • Kang, Sungho
  • 2024-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Institute of Electrical and Electronics Engineers Inc.
A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis Method for HBM
  • Yoon, Joonsik;
  • Lee, Hayoung;
  • Moon, Youngki;
  • Ho Shin, Seung;
  • Kang, Sungho
  • 2025-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.44 No.5, pp.2014-2025
  • Institute of Electrical and Electronics Engineers Inc.
A comparative study of charge trapping effect in p-type MoTe2 and WSe2 FETs using pulsed current-voltage measurements
  • Yang, Jeong Yong;
  • Lee, Chan Ho;
  • Oh, Young Taek;
  • Ma, Jiyeon;
  • Heo, Junseok;
  • Yoo, Geonwook
  • 2021-01-01
  • Japanese Journal of Applied Physics, Vol.60 No.1
  • IOP Publishing Ltd
A Cost-Effective Per-Pin ALPG for High-Speed Memory Testing
  • 2025-01-01
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol.33 No.3, pp.867-871
  • Institute of Electrical and Electronics Engineers Inc.
A graphene-assisted all-pass filter for a tunable terahertz transmissive modulator with near-perfect absorptionoa mark
  • 2019-12-01
  • Scientific Reports, Vol.9 No.1
  • Nature Publishing Group
A New Pipelined Output Data Reducer of BOST for Improved Parallelism
  • 2025-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.44 No.2, pp.765-776
  • Institute of Electrical and Electronics Engineers Inc.
A Novel CNN-Based Redundancy Analysis Using Parallel Solution Decision
  • Shin, Seung Ho;
  • Cheong, Minho;
  • Lee, Hayoung;
  • Kim, Byungsoo;
  • Kang, Sungho
  • 2025-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Institute of Electrical and Electronics Engineers Inc.
A Phase-Locked Minimum-Energy-Point-Tracking Enabled by Unified-Clock-Power-and-Body-Bias Slack Regulation and PI-Ratio Based In-Situ Loop Gain Optimization with 97.4% Supply Voltage Margin Recovery at Minimum-Energy-Point in 28nm FDSOI
  • Jeong, Minhyeok;
  • Gi, Hyungmin;
  • Cho, Minsik;
  • Kim, Mingyu;
  • Kim, Donggyu;
  • Park, Sungyong;
  • Lee, Woonjae;
  • Kim, Seonho;
  • Yoon, Yeohoon;
  • Han, Shin;
et al
  • 2025-01-01
  • Proceedings of the Custom Integrated Circuits Conference
  • Institute of Electrical and Electronics Engineers Inc.
A Robust Test Architecture for Low-Power AI Accelerators
  • 2024-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Institute of Electrical and Electronics Engineers Inc.
A Robust Test Architecture for Low-Power AI Accelerators
  • 2025-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.44 No.4, pp.1581-1594
  • Institute of Electrical and Electronics Engineers Inc.
A Synthesizable Thyristor-Like Leakage-Based True Random Number Generator
  • 2025-01-01
  • Proceedings -Design, Automation and Test in Europe, DATE
  • Institute of Electrical and Electronics Engineers Inc.
Achieving Highly Sensitive Near-Infrared Organic Photodetectors using Asymmetric Non-Fullerene Acceptoroa mark
  • Lee, Un Hak;
  • Park, Byoungwook;
  • Rhee, Seunghyun;
  • Ha, Jong Woon;
  • Whang, Dong Ryeol;
  • Eun, Hyeong Ju;
  • Kim, Jong H.;
  • Shim, Yeongseok;
  • Heo, Junseok;
  • Lee, Changjin;
et al
  • 2023-09-04
  • Advanced Optical Materials, Vol.11 No.17
  • John Wiley and Sons Inc
An Area-Efficient Systolic Array Redundancy Architecture for Reliable AI Accelerator
  • 2024-01-01
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol.32 No.10, pp.1950-1954
  • Institute of Electrical and Electronics Engineers Inc.
An Efficient Scan Diagnosis for Intermittent Faults using CNN with Multi-Channel Dataoa mark
  • Yun, Hyojoon;
  • Lim, Hyeonchan;
  • Lee, Hayoung;
  • Yoon, Doohyun;
  • Kang, Sungho
  • 2024-01-01
  • IEEE Access
  • Institute of Electrical and Electronics Engineers Inc.
An Efficient Test Architecture Using Hybrid Built-In Self-Test for Processing-in-Memory
  • 2024-01-01
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • Institute of Electrical and Electronics Engineers Inc.
An Efficient Test Architecture Using Hybrid Built-In Self-Test for Processing-in-Memory
  • 2025-01-01
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol.33 No.5, pp.1452-1456
  • Institute of Electrical and Electronics Engineers Inc.
Analysis of bending-induced degradation of orbital angular momentum modes in optical fibersoa mark
  • 2019-01-01
  • Photonics, Vol.6 No.3
  • MDPI AG
Area-Selective Atomic Layer Deposition for Resistive Random-Access Memory Devices
  • Oh, Il Kwon;
  • Khan, Asir Intisar;
  • Qin, Shengjun;
  • Lee, Yujin;
  • Wong, H. S.Philip;
  • Pop, Eric;
  • Bent, Stacey F.
  • 2023-09-13
  • ACS Applied Materials and Interfaces, Vol.15 No.36, pp.43087-43093
  • American Chemical Society
Area-Selective Atomic Layer Deposition on Homogeneous Substrate for Next-Generation Electronic Devices
  • Rhee, Min Jeong;
  • Won, Byoungjun;
  • Lim, Young Jin;
  • Song, Jeong Gyu;
  • Kim, Sunghyun;
  • Oh, Il Kwon
  • 2025-06-12
  • Advanced Science, Vol.12 No.22
  • John Wiley and Sons Inc
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