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to 10 of 1124 (Search time: 0.0 seconds).
Bias-stress-stable sub-1.5V oxide thin-film transistors via synergistic composition of sol-gel quaternary high-k oxide dielectrics
oa mark
Baek, Seokhyeon;
Choi, Jun Gyu;
Lee, Won June;
Kwak, Taehyun;
Jo, Yong Ryun;
Park, Sungjun
2024-08-05
Journal of Alloys and Compounds, Vol.994
Elsevier Ltd
Influence of UV/Ozone Treatment on Threshold Voltage Modulation in Sol–Gel IGZO Thin-Film Transistors
Kim, Wonsik;
Lee, Won June;
Kwak, Taehyun;
Baek, Seokhyeon;
Lee, Seung Hoon;
Park, Sungjun
2022-04-01
Advanced Materials Interfaces, Vol.9
John Wiley and Sons Inc
The Significance of an In Situ ALD Al2O3 Stacked Structure for p-Type SnO TFT Performance and Monolithic All-ALD-Channel CMOS Inverter Applications
oa mark
Kim, Hye Mi;
Choi, Su Hwan;
Lee, Han Uk;
Cho, Sung Beom
;
Park, Jin Seong
2023-04-01
Advanced Electronic Materials, Vol.9
John Wiley and Sons Inc
Ultrahigh-Speed In-Memory Electronics Enabled by Proximity-Oxidation-Evolved Metal Oxide Redox Transistors
Kumar, Mohit
;
Kim, Unjeong;
Lee, Wang Gon;
Seo, Hyungtak
2022-05-01
Advanced Materials, Vol.34
John Wiley and Sons Inc
Review of Material Properties of Oxide Semiconductor Thin Films Grown by Atomic Layer Deposition for Next-Generation 3D Dynamic Random-Access Memory Devices
Choi, Ae Rim;
Lim, Dong Hyun;
Shin, So Yeon;
Kang, Hye Joo;
Kim, Dohee;
Kim, Ja Yong;
Ahn, Youngbae;
Ryu, Seung Wook;
Oh, Il Kwon
2024-03-12
Chemistry of Materials, Vol.36, pp.2194-2219
American Chemical Society
Hydrogen Barriers Based on Chemical Trapping Using Chemically Modulated Al2O3Grown by Atomic Layer Deposition for InGaZnO Thin-Film Transistors
Lee, Yujin;
Nam, Taewook;
Seo, Seunggi;
Yoon, Hwi;
Oh, Il Kwon
;
Lee, Chong Hwon;
Yoo, Hyukjoon;
Kim, Hyun Jae;
Choi, Wonjun;
Im, Seongil;
Yang, Joon Young;
Choi, Dong Wook;
Yoo, Choongkeun;
Kim, Ho Jin;
Kim, Hyungjun
2021-05-05
ACS Applied Materials and Interfaces, Vol.13, pp.20349-20360
American Chemical Society
Multivalued logic devices via directly patterned sol-gel metal oxide materials
김원식
2023-08
The Graduate School, Ajou University
Approaching the Nernst Detection Limit in an Electrolyte-Gated Metal Oxide Transistor
Lee, Seyeong;
Park, Sungjun
;
Kim, Chang Hyun;
Yoon, Myung Han
2021-01-01
IEEE Electron Device Letters, Vol.42, pp.50-53
Institute of Electrical and Electronics Engineers Inc.
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