Ajou University repository

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Showing results 1 to 10 of 1872 (Search time: 0.0 seconds).

FTL 에서의 전력 손실에 관한 사상정보 복구 및 압축 알고리즘
  • 정지환
  • 2017-02
  • The Graduate School, Ajou University
A Recovery Technique for Flash Memory Using Shadow Paging
  • ABDULGHAFUR, ALAHMADI ABDULHADI
  • 2015-08
  • The Graduate School, Ajou University
A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis Method for HBM
  • Yoon, Joonsik;
  • Lee, Hayoung;
  • Moon, Youngki;
  • Shin, Seung Ho;
  • Kang, Sungho
  • 2024-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Institute of Electrical and Electronics Engineers Inc.
An Efficient and Reliable Flash Translation Layer for Chip-Level-Parallel Flash Memory
  • Kwon, Se Jin
  • 2012-08
  • The Graduate School, Ajou University
Effective Parallel Redundancy Analysis Using GPU for Memory Repair
  • 2025-01-01
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol.33, pp.462-474
  • Institute of Electrical and Electronics Engineers Inc.
Design of shape memory alloy coil spring actuator for improving performance in cyclic actuationoa mark
  • 2018-11-19
  • Materials, Vol.11
  • MDPI AG
Fast and robust Hausdorff distance computation from triangle mesh to quad mesh in near-zero cases
  • 2018-05-01
  • Computer Aided Geometric Design, Vol.62, pp.91-103
  • Elsevier B.V.
Toward Advanced High-k and Electrode Thin Films for DRAM Capacitors via Atomic Layer Deposition
  • Kim, Se Eun;
  • Sung, Ju Young;
  • Jeon, Jae Deock;
  • Jang, Seo Young;
  • Lee, Hye Min;
  • Moon, Sang Mo;
  • Kang, Jun Goo;
  • Lim, Han Jin;
  • Jung, Hyung Suk;
  • Lee, Sang Woon
  • 2023-10-24
  • Advanced Materials Technologies, Vol.8
  • John Wiley and Sons Inc
Area-Selective Atomic Layer Deposition for Resistive Random-Access Memory Devices
  • Oh, Il Kwon;
  • Khan, Asir Intisar;
  • Qin, Shengjun;
  • Lee, Yujin;
  • Wong, H. S.Philip;
  • Pop, Eric;
  • Bent, Stacey F.
  • 2023-09-13
  • ACS Applied Materials and Interfaces, Vol.15, pp.43087-43093
  • American Chemical Society
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