Ajou University repository

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Showing results 1 to 10 of 1680 (Search time: 0.0 seconds).

Positive Interaction between Charge Trapping and Polarization Switching in Metal-Interlayer-Ferroelectric-Interlayer-Silicon (MIFIS) Ferroelectric Field-Effect Transistor
  • Choi, Hyojun;
  • Kim, Giuk;
  • Lee, Sangho;
  • Shin, Hunbeom;
  • Lim, Youngjin;
  • Kim, Kang;
  • Kim, Do Hyung;
  • Oh, Il Kwon;
  • Park, Sang Hee Ko;
  • Ahn, Jinho;
  • Jeon, Sanghun
  • 2024-01-01
  • IEEE Electron Device Letters, Vol.45, pp.2351-2354
  • Institute of Electrical and Electronics Engineers Inc.
Adaptive-Sliding-Window-Based Detection for Noncooperative Spectrum Sensing in Radar Band
  • Noh, Jiyoon;
  • Kwon, Yohan;
  • Lee, Juhyung;
  • Baek, Hoki;
  • Lim, Jaesung
  • 2022-09-01
  • IEEE Systems Journal, Vol.16, pp.3878-3881
  • Institute of Electrical and Electronics Engineers Inc.
공간 지연과제 수행 중 전전두피질 집단신경신호의 정보 디코딩
  • 김지은
  • 2006-02
  • The Graduate School, Ajou University
Ultrahigh-Speed In-Memory Electronics Enabled by Proximity-Oxidation-Evolved Metal Oxide Redox Transistors
  • 2022-05-01
  • Advanced Materials, Vol.34
  • John Wiley and Sons Inc
An Efficient and Reliable Flash Translation Layer for Chip-Level-Parallel Flash Memory
  • Kwon, Se Jin
  • 2012-08
  • The Graduate School, Ajou University
Design of shape memory alloy coil spring actuator for improving performance in cyclic actuationoa mark
  • 2018-11-19
  • Materials, Vol.11
  • MDPI AG
Effective Parallel Redundancy Analysis Using GPU for Memory Repair
  • 2025-01-01
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol.33, pp.462-474
  • Institute of Electrical and Electronics Engineers Inc.
대용량 저장장치에서 PCM을 활용한 효율적인 메모리 관리기법
  • Noh Taehoon
  • 2016-08
  • The Graduate School, Ajou University
Experimental Analysis on the Interaction Between Interface Trap Charges and Polarization on the Memory Window of Metal-Ferroelectric-Insulator-Si (MFIS) FeFET
  • Kim, Giuk;
  • Choi, Hyojun;
  • Lee, Sangho;
  • Shin, Hunbeom;
  • Lee, Sangmok;
  • Nam, Yunseok;
  • Kang, Hyunjun;
  • Shin, Seokjoong;
  • Kim, Hoon;
  • Lim, Youngjin;
  • Kim, Kang;
  • Oh, Il Kwon;
  • Ko Park, Sang Hee;
  • Ahn, Jinho;
  • Jeon, Sanghun
  • 2024-01-01
  • IEEE Transactions on Electron Devices, Vol.71, pp.6627-6632
  • Institute of Electrical and Electronics Engineers Inc.
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