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to 10 of 5393 (Search time: 0.0 seconds).
Asymmetric Double-Gate β-Ga2O3 Nanomembrane Field-Effect Transistor for Energy-Efficient Power Devices
Ma, Jiyeon;
Cho, Hyung Jun;
Heo, Junseok
;
Kim, Sunkook;
Yoo, Geonwook
2019-06-01
Advanced Electronic Materials, Vol.5
Blackwell Publishing Ltd
Impact of Work-Function Variation in Ferroelectric Field-Effect Transistor
oa mark
Yeon Jung, Su;
Kim, Hyunwoo;
Lee, Jongmin
;
Hyun Kim, Jang
2024-01-01
IEEE Journal of the Electron Devices Society, Vol.12, pp.779-784
Institute of Electrical and Electronics Engineers Inc.
Investigating versatile capabilities of organic field-effect transistors incorporated with vacuum-deposited metal nanoparticles
Kim, Ji Hwan;
Jo, Il Young;
Baek, Seokhyeon;
Cho, Hong Rae;
Park, Sungjun
;
Lee, Jongwon;
Kim, Chang Hyun;
Yoon, Myung Han
2024-04-08
Journal of Materials Chemistry C, Vol.12, pp.5941-5950
Royal Society of Chemistry
Optimization of Dual-workfunction Line Tunnel Field-effect Transistor with Island Source Junction
Yun, Chaewon;
Kim, Sangwan;
Cho, Seongjae;
Cho, Il Hwan;
Kim, Hyunwoo;
Kim, Jang Hyun
;
Kim, Garam
2023-08-01
Journal of Semiconductor Technology and Science, Vol.23, pp.207-214
Institute of Electronics Engineers of Korea
Ternary Logic Transistors Using Multi-Stacked 2D Electron Gas Channels in Ultrathin Oxide Heterostructures
oa mark
Choi, Ji Hyeon;
Seok, Tae Jun;
Kim, Sang June;
Dae, Kyun Seong;
Jang, Jae Hyuck;
Cho, Deok Yong;
Lee, Sang Woon
;
Park, Tae Joo
2025-02-10
Advanced Science, Vol.12
John Wiley and Sons Inc
Improvement of Thermal Characteristics and On-Current in Vertically Stacked Nanosheet FET by Parasitic Channel Height Engineering
oa mark
Song, Young Suh;
Kim, Hyunwoo;
Kim, Jang Hyun
2024-01-01
IEEE Access, Vol.12, pp.105878-105886
Institute of Electrical and Electronics Engineers Inc.
Demonstration of a Frequency Doubler Using a Tunnel Field-Effect Transistor with Dual Pocket Doping
oa mark
Kim, Jang Hyun
;
Kim, Hyunwoo
2023-12-01
Electronics (Switzerland), Vol.12
Multidisciplinary Digital Publishing Institute (MDPI)
Effects of Material and Doping Profile Engineering of Source Junction on Line Tunneling FET Operations
Ko, Min Ki;
Kim, Jang Hyun
;
Kim, Garam
2023-08-01
Journal of Semiconductor Technology and Science, Vol.23, pp.228-235
Institute of Electronics Engineers of Korea
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