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Showing results 1 to 10 of 3909 (Search time: 0.0 seconds).

Hyperspectral microscopy of atomically thin materials
  • 2024-12-01
  • Current Applied Physics, Vol.68, pp.20-25
  • Elsevier B.V.
Toward Advanced High-k and Electrode Thin Films for DRAM Capacitors via Atomic Layer Deposition
  • Kim, Se Eun;
  • Sung, Ju Young;
  • Jeon, Jae Deock;
  • Jang, Seo Young;
  • Lee, Hye Min;
  • Moon, Sang Mo;
  • Kang, Jun Goo;
  • Lim, Han Jin;
  • Jung, Hyung Suk;
  • Lee, Sang Woon
  • 2023-10-24
  • Advanced Materials Technologies, Vol.8
  • John Wiley and Sons Inc
Alternative surface reaction route in the atomic layer deposition of NbN thin films for reduced resistivity
  • Lee, Hyeok Jae;
  • Jang, Seo Young;
  • Lee, Hye Min;
  • Sung, Ju Young;
  • Kim, Se Eun;
  • Jeon, Jae Deock;
  • Yun, Yewon;
  • Lee, Sang Woon
  • 2023-08-15
  • Journal of Alloys and Compounds, Vol.952
  • Elsevier Ltd
Highly flexible deep-ultraviolet photodetectors using amorphous gallium oxide thin films grown by atomic layer deposition
  • 2022-12-01
  • Materials Today Communications, Vol.33
  • Elsevier Ltd
Atomic layer deposition of high-k and metal thin films for high-performance DRAM capacitors: A brief review
  • Kim, Se Eun;
  • Sung, Ju Young;
  • Yun, Yewon;
  • Jeon, Byeongjun;
  • Moon, Sang Mo;
  • Lee, Han Bin;
  • Lee, Chae Hyun;
  • Jung, Hae Jun;
  • Lee, Jae Ung;
  • Lee, Sang Woon
  • 2024-08-01
  • Current Applied Physics, Vol.64, pp.8-15
  • Elsevier B.V.
Large-Scale Analysis of Defects in Atomically Thin Semiconductors using Hyperspectral Line Imagingoa mark
  • Lim, Seungjae;
  • Kim, Tae Wan;
  • Park, Taejoon;
  • Heo, Yoon Seong;
  • Yang, Seonguk;
  • Seo, Hosung;
  • Suh, Joonki;
  • Lee, Jae Ung
  • 2024-10-17
  • Small, Vol.20
  • John Wiley and Sons Inc
Strained BaTiO3 thin films via in-situ crystallization using atomic layer deposition on SrTiO3 substrate
  • Choi, Heung Yoon;
  • Jeon, Jae Deock;
  • Kim, Se Eun;
  • Jang, Seo Young;
  • Sung, Ju Young;
  • Lee, Sang Woon
  • 2023-06-15
  • Materials Science in Semiconductor Processing, Vol.160
  • Elsevier Ltd
Vanadium oxide thin film deposited on Si by atomic layer deposition for non-volatile resistive switching memory devices
  • 2023-12-01
  • Applied Surface Science, Vol.639
  • Elsevier B.V.
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