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Title
Author
Keyword
Date
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Communities
Authors
Journal
IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN
E
2160-7516
P
2160-7508
Publisher
IEEE
Listed on
(Coverage)
SJR
2004-2007;2012-2017;2019-2020
SCOPUS
2017;2024
Active
NA
Country
USA
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Article List
Showing results 1 to 5 of 5
Exploiting Distortion Information for Multi-degraded Image Restoration
Shin, Wooksu;
Ahn, Namhyuk;
Moon, Jeong Hyeon;
Sohn, Kyung Ah
2022-01-01
IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, Vol.2022-June, pp.536-545
IEEE Computer Society
SimUSR: A simple but strong baseline for unsupervised image super-resolution
oa mark
Ahn, Namhyuk;
Yoo, Jaejun;
Sohn, Kyung Ah
2020-06-01
IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, Vol.2020-June, pp.1953-1961
IEEE Computer Society
NTIRE 2020 challenge on real-world image super-resolution: Methods and results
Lugmayr, Andreas;
Danelljan, Martin;
Timofte, Radu;
Ahn, Namhyuk;
Bai, Dongwoon;
Cai, Jie;
Cao, Yun;
Chen, Junyang;
Cheng, Kaihua;
Chun, Se Young;
et al
2020-06-01
IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, Vol.2020-June, pp.2058-2076
IEEE Computer Society
Image super-resolution via progressive cascading residual network
Ahn, Namhyuk;
Kang, Byungkon;
Sohn, Kyung Ah
2018-12-13
IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, Vol.2018-June, pp.904-912
IEEE Computer Society
NTIRE 2018 challenge on single image super-resolution: Methods and results
oa mark
Timofte, Radu;
Gu, Shuhang;
Wu, Jiqing;
Van Gool, Luc;
Zhang, Lei;
Yang, Ming Hsuan;
Haris, Muhammad;
Shakhnarovich, Greg;
Ukita, Norimichi;
Hu, Shijia;
et al
2018-12-13
IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, Vol.2018-June, pp.965-976
IEEE Computer Society
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