Ajou University repository

반도체메모리테스터에서 임베디드시스템의 사용방안에 관한 연구
  • 김창환
Citations

SCOPUS

0

Citation Export

Advisor
김영길
Affiliation
아주대학교 산업대학원
Department
산업대학원 정보전자공학과
Publication Year
2009-02
Publisher
The Graduate School, Ajou University
Keyword
메모리테스터임베디드시스템병렬분산처리시스템
Description
학위논문(석사)--아주대학교 산업대학원 :정보전자공학과,2009. 2
Alternative Abstract
Nowadays, we use many funcution of IT in the semiconductor testing system. All of them, more important part is how to saving the test time. So, Tester Engineers is studying about the semiconductor testing sequence. We studied about Parallel testing sequence , and apply multi CPU system. This paper presents the multi cpu system in the semiconductor testing system. And , how to think about standard for multi cpu system operation.
Language
kor
URI
https://aurora.ajou.ac.kr/handle/2018.oak/6840
Journal URL
http://dcoll.ajou.ac.kr:9080/dcollection/jsp/common/DcLoOrgPer.jsp?sItemId=000000009472
Type
Thesis
Show full item record

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Total Views & Downloads

File Download

  • There are no files associated with this item.