Ajou University repository

SRBML: A Single-Event-Upset Recoverable and BTI-Mitigated Latch Design for Long-Term Reliability Enhancement
  • Xia, Fan ;
  • Zhang, Jing ;
  • Ali, Jehad ;
  • Zhang, Chunjiong ;
  • Wen, Xiaoqing ;
  • Yan, Aibin
Citations

SCOPUS

0

Citation Export

Publication Year
2024-01-01
Journal
Proceedings - ITC-Asia 2024: 8th IEEE International Test Conference in Asia
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
Proceedings - ITC-Asia 2024: 8th IEEE International Test Conference in Asia
Keyword
aginglatch reliabilitysingle-event-upsetsoft error rate
Mesh Keyword
Bias-temperature instabilityCircuit functionalityInternal structureLatch reliabilityPrimary factorsReliability enhancementSingle event upsetsSoft errorSoft error rateStress time
All Science Classification Codes (ASJC)
Computer Vision and Pattern RecognitionHardware and ArchitectureInformation Systems and ManagementElectrical and Electronic EngineeringSafety, Risk, Reliability and QualityInstrumentation
Abstract
Soft-errors and aging are considered as two primary factors affecting the long-term reliability of aerospace integrated circuits (ICs). As one of the key components in aerospace ICs, latches play a pivotal role to ensure desirable circuit functionality. This paper presents a single-event-upset recovery latch, namely SRBML, with bias-temperature-instability (BTI)-mitigation. By optimizing its internal structure, the latch can recover from single-event-upsets (SEUs) and reduce the stress time of transistors in feedback loops to simultaneously mitigate the impact of BTI on the latch. Simulation results demonstrate that the soft error rate increase due to BTI is reduced by roughly 34% for SRBML after BTI-mitigation. In addition, the delay of SRBML is not affected, and the area and power increase are limited compared to BTI-unmitigated latches.
Language
eng
URI
https://aurora.ajou.ac.kr/handle/2018.oak/37133
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85204793988&origin=inward
DOI
https://doi.org/10.1109/itc-asia62534.2024.10661343
Journal URL
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=10661305
Type
Conference
Show full item record

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

ALI JEHAD Image
ALI JEHADJEHAD, ALI
Department of Software and Computer Engineering
Read More

Total Views & Downloads

File Download

  • There are no files associated with this item.