Ajou University repository

Influence of Open Switch Failure on Normal Devices in HANPC Inverters
Citations

SCOPUS

0

Citation Export

Publication Year
2021-01-01
Journal
ICEMS 2021 - 2021 24th International Conference on Electrical Machines and Systems
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
ICEMS 2021 - 2021 24th International Conference on Electrical Machines and Systems, pp.506-509
Keyword
Open switch faultSiC inverterSwitch lossThree-level hybrid ANPC inverter
Mesh Keyword
Active neutral point clampedNeutral-point clamped invertersOpen switch faultOutput qualitySiC inverteSwitch failureSwitch faultsSwitch lossThree-levelThree-level hybrid ANPC inverte
All Science Classification Codes (ASJC)
Electrical and Electronic EngineeringMechanical EngineeringSafety, Risk, Reliability and Quality
Abstract
This paper analyzes the normal switches losses under open switch failures in three-level hybrid active neutral point clamped (HANPC) inverters. Three-level HANPC inverter has numerous Si-IGBTs and SiC-MOSFETs to improve the output quality. However, the three-level HANPC inverter has high percent of switch failures due to using many switches. When the switch is under a short fault, the inverter system should be shut down thought overcurrent detection. On the other hand, the open switch failure is difficult to detect depending on fault-switch location. In addition, the output quality is worsened and other devices get damages. The switch losses after open switch failure are analyzed to prevent the secondary switch failure in the future. The simulation results demonstrate the influence of switch devices considering the various open switch failure scenarios
Language
eng
URI
https://aurora.ajou.ac.kr/handle/2018.oak/36725
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85123940332&origin=inward
DOI
https://doi.org/10.23919/icems52562.2021.9634586
Journal URL
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=9634173
Type
Conference
Funding
ACKNOWLEDGMENT This work was supported in part by the National Research Foundation of Korea(NRF) grant funded by the Korea government(MSIT) (No. 2020R1G1A110040611) and in part by the National Research Foundation of Korea (NRF) funded by the Ministry of Science and ICT for First-Mover Program for Accelerating Disruptive Technology Development (NRF-2018M3C1B9088457)
Show full item record

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

 Lee, Kyo-Beum Image
Lee, Kyo-Beum이교범
Department of Electrical and Computer Engineering
Read More

Total Views & Downloads

File Download

  • There are no files associated with this item.