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Towards recovering fault traceability links by using information retrieval technique
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Publication Year
2018-01-01
Journal
Lecture Notes in Electrical Engineering
Publisher
Springer Verlag
Citation
Lecture Notes in Electrical Engineering, Vol.474, pp.1180-1185
Keyword
FaultInformation retrievalSoftware artifactTraceability recovery
Mesh Keyword
Fault managementIncident reportsProject progressSoftware artifactsSoftware requirements specificationsSoftware source codesSystem testingTraceability links
All Science Classification Codes (ASJC)
Industrial and Manufacturing Engineering
Abstract
As the software R&D project progresses, various software artifacts such as software test case, software test descriptions, software source codes, software design descriptions, and software requirements specification will inevitably be produced. When developer performs the system testing, software bugs will be found if there is fault in it. After that, developer will write up an incident report for fault management, and then developer will try to find the artifacts for checking and fixing. Because developer must check the requirement before the fixing and developer has to get the source code including the bug and its test case for fixing and unit testing. Therefore, useful approach should be proposed in order to trace the artifacts from incident report. In this paper, we propose a novel approach for recovering fault traceability links by using IR technique to show that our approach can be a useful solution.
Language
eng
URI
https://aurora.ajou.ac.kr/handle/2018.oak/36251
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85039436801&origin=inward
DOI
https://doi.org/10.1007/978-981-10-7605-3_188
Journal URL
http://www.springer.com/series/7818
Type
Conference
Funding
Acknowledgments. This research was supported by Next-Generation Information Computing Development Program (NRF-2014M3C4A7030504) and by Basic Science Research Program (NRF-2017R1A2B4009937) through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT & Future Planning.This research was supported by Next-Generation Information Computing Development Program (NRF-2014M3C4A7030504) and by Basic Science Research Program (NRF-2017R1A2B4009937) through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT & Future Planning.
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LEE, JUNG WON Image
LEE, JUNG WON이정원
Department of Electrical and Computer Engineering
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