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Showing results 1 to 10 of 5373 (Search time: 0.0 seconds).

Impact of Work-Function Variation in Ferroelectric Field-Effect Transistoroa mark
  • 2024-01-01
  • IEEE Journal of the Electron Devices Society, Vol.12, pp.779-784
  • Institute of Electrical and Electronics Engineers Inc.
Work-Function Variation and Delay Analysis in NAND and NOR Circuits using Gate Insulator Stack-based Dopingless Tunnel Field-effect Transistors
  • 2024-12-01
  • Journal of Semiconductor Technology and Science, Vol.24, pp.557-564
  • Institute of Electronics Engineers of Korea
Analysis and Prediction of Nanowire TFET’s Work Function Variation
  • 2024-04-01
  • Journal of Semiconductor Technology and Science, Vol.24, pp.96-104
  • Institute of Electronics Engineers of Korea
Network Intrusion Detection in Internet of Blended Environment Using Ensemble of Heterogeneous Autoencoders (E-HAE)oa mark
  • Jilcha, Lelisa Adeba;
  • Kim, Deuk Hun;
  • Jang-Jaccard, Julian;
  • Kwak, Jin
  • 2023-01-01
  • Computer Systems Science and Engineering, Vol.46, pp.3261-3284
  • Tech Science Press
A Novel Fractional-Order Variational Approach for Image Restoration Based on Fuzzy Membership Degreesoa mark
  • Khan, Mushtaq Ahmad;
  • Ullah, Asmat;
  • Khan, Sahib;
  • Ali, Murtaza;
  • Khan, Sheraz;
  • Khan, Khalil;
  • Masud, Mehedi;
  • Ali, Jehad
  • 2021-01-01
  • IEEE Access, Vol.9, pp.43574-43600
  • Institute of Electrical and Electronics Engineers Inc.
Mitigating Clonal Variation in Recombinant Mammalian Cell Lines
  • Lee, Jae Seong;
  • Kildegaard, Helene Faustrup;
  • Lewis, Nathan E.;
  • Lee, Gyun Min
  • 2019-09-01
  • Trends in Biotechnology, Vol.37, pp.931-942
  • Elsevier Ltd
Adaptive Momentum-Based Loss Rebalancing for Monocular Depth Estimationoa mark
  • 2023-01-01
  • IEEE Access, Vol.11, pp.115150-115160
  • Institute of Electrical and Electronics Engineers Inc.
In-situ fatigue monitoring procedure using nonlinear ultrasonic surface waves considering the nonlinear effects in the measurement systemoa mark
  • 2019-06-01
  • Nuclear Engineering and Technology, Vol.51, pp.867-876
  • Korean Nuclear Society
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