Ajou University repository

  • Add filters:
  • Results/Page
  • Sort by
  • In order
  • Authors/record

Showing results 1 to 10 of 887 (Search time: 0.0 seconds).

Reflectivity measurement of a silicon carbide mirror sample for ITER divertor vacuum ultraviolet spectrometer
  • Kim, Yoo Kwan;
  • Seon, Changrae;
  • An, Younghwa;
  • Hong, Joohwan;
  • Cheon, Munseong;
  • Kim, Boseong;
  • Kim, Yu Kwon
  • 2024-08-01
  • Review of Scientific Instruments, Vol.95
  • American Institute of Physics
Design of a Flexible Thin-Film Encapsulant with Sandwich Structures of Perhydropolysilazane Layers
  • Kim, Dajeong;
  • Jeon, Gyeong G.;
  • Kim, Jong H.;
  • Kim, Jincheol;
  • Park, Nochang
  • 2022-08-03
  • ACS Applied Materials and Interfaces, Vol.14, pp.34678-34685
  • American Chemical Society
Characterization of vacuum-deposited and solution-processed N, N′-bis-(1-naphthyl)-N, N′-diphenyl-1, 1′-biphenyl-4, 4′-diamine hole transport layers based organic light emitting devices
  • 2021-01-01
  • Optical Materials, Vol.111
  • Elsevier B.V.
Extremely high photoconductivity ultraviolet-light sensor using amorphous In–Ga–Zn–O thin-film-transistor
  • 2021-06-01
  • Journal of the Korean Physical Society, Vol.78, pp.1221-1226
  • Korean Physical Society
Improved visible-blindness of AlGaN deep ultraviolet photodiode with monolithically integrated angle-insensitive Fabry–Perot filteroa mark
  • Kim, Dohyun;
  • Han, Seungho;
  • Jung, Joocheol;
  • Baek, Yongmin;
  • Son, John;
  • Lee, Kyusang;
  • Heo, Junseok
  • 2019-01-01
  • Optics Express, Vol.27, pp.37446-37453
  • OSA - The Optical Society
Advancing Fab-Compatible Color-Selective Organic Photodiodes: Tailored Molecular Design and Nanointerlayers
  • Pyo, Won Jun;
  • Kim, Gyuri;
  • Kim, Sinwon;
  • Oh, Haechan;
  • Keum, Dongki;
  • Kim, Byoungin;
  • Kim, Dowan;
  • So, Chan;
  • Lee, Sangjun;
  • Jee, Dong Woo;
  • Jung, In Hwan;
  • Chung, Dae Sung
  • 2024-07-02
  • ACS Nano, Vol.18, pp.17075-17085
  • American Chemical Society
Vacuum leak detection method using index regression and correction for semiconductor equipment in a vacuum chamberoa mark
  • 2021-12-01
  • Applied Sciences (Switzerland), Vol.11
  • MDPI
1 2 3 4 89

Discover