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to 10 of 272 (Search time: 0.0 seconds).
Practical Gravimetric Flow Rate Measurement Method for Slot-Die Coating Uniformity Evaluation
Yoon, Kyung Taek;
Bae, Jeong Hyun;
Choi, Young Man
2023-02-01
Journal of the Korean Society for Precision Engineering, Vol.40, pp.105-111
Korean Society for Precision Engineeing
유닛셀/스택 유동프레임 설계 개선을 통한 레독스 흐름전지 성능향상에 대한 연구
박준용
2020-08
The Graduate School, Ajou University
On the Convexity of the MSE Distortion of Symmetric Uniform Scalar Quantization
Na, Sangsin
;
Neuhoff, David L.
2018-04-01
IEEE Transactions on Information Theory, Vol.64, pp.2626-2638
Institute of Electrical and Electronics Engineers Inc.
Monotonicity of step sizes of MSE-Optimal symmetric uniform scalar quantizers
Na, Sangsin
;
Neuhoff, David L.
2019-03-01
IEEE Transactions on Information Theory, Vol.65, pp.1782-1792
Institute of Electrical and Electronics Engineers Inc.
A Critical Set-based Non-uniform Segmentation Method for Successive Cancellation Flip Decoder of Polar Codes
황보찬
2021-02
The Graduate School, Ajou University
Fabrication of a uniform quantum dot film with a high quantum yield
oa mark
Oh, Min Woo;
Son, Byung Hee;
Yoon, Jee Sang;
Yoo, Yonghwan;
Kim, Yongduk;
Choi, Soo Bong;
Ahn, Yeong Hwan
;
Cho, Won Bae;
Park, Doo Jae
2024-10-29
Nanotechnology, Vol.36
Uniform pressing mechanism in large-area roll-to-roll nanoimprint lithography process
oa mark
Kim, Ga Eul;
Kim, Hyuntae;
Woo, Kyoohee;
Kang, Yousung;
Lee, Seung Hyun;
Jeon, Yongho
;
Lee, Moon G.
;
Kwon, Sin
2021-10-01
Applied Sciences (Switzerland), Vol.11
MDPI
Force uniformity control for large-area roll-to-roll process
Nguyen, Truong Sinh;
Lee, Seung Hyun;
Kim, Ga Eul;
Kwon, Sin;
Kim, Kyung Rok;
Park, Pyoungwon;
Kim, Kwang Young;
Kim, Seho;
Choi, Young Man
;
Kim, Kyunghoon
2021-10-01
Review of Scientific Instruments, Vol.92
American Institute of Physics Inc.
Design of a Small NEMP Simulator for the Immunity Test of Core Electronic Components in HEMP Environments
oa mark
Kim, Young Jin
;
Jeong, Young Kyung;
Youn, Dong Gi;
Park, Hyun Ho;
Park, Yong Bae
2020-01-01
IEEE Access, Vol.8, pp.217773-217780
Institute of Electrical and Electronics Engineers Inc.
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chemical vapor deposition
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Phase change material
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