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to 10 of 1169 (Search time: 0.0 seconds).
Optimal soft-switching scheme for bidirectional DC-DC converters with auxiliary circuit
Lee, Han Rim;
Park, Jin Hyuk;
Lee, Kyo Beum
2018-05-01
Journal of Power Electronics, Vol.18, pp.681-693
Korean Institute of Power Electronics
전동기 구동용 3-레벨 인버터의 신뢰성을 위한 중성점 전압 제어
이현희
2013-02
The Graduate School, Ajou University
Superjunction IGBT with split carrier storage layer
Yoon, Tae Young;
Shin, Dongho;
Kim, Hyunwoo;
Kim, Jang Hyun
2024-07-01
Semiconductor Science and Technology, Vol.39
Institute of Physics
산화층을 높인 VCSEL의 설계 및 특성 분석
KIM, TAEYONG
2010-08
The Graduate School, Ajou University
A bidirectional double uneven power converter based dc–dc converter for solid-state transformers
oa mark
Park, Kiwoo;
Lee, Kyo Beum
2018-01-01
Electronics (Switzerland), Vol.7
MDPI AG
Electronic band alignment in AlGaN/GaN high electron-mobility transistors investigated using scanning photocurrent microscopy
Kim, Y. C.;
Son, B. H.;
Jeong, H. Y.;
Park, K. H.;
Ahn, Y. H.
2019-04-01
Current Applied Physics, Vol.19, pp.406-410
Elsevier B.V.
보조 회로를 갖는 양방향 DC-DC 컨버터의 최적 소프트 스위칭 기법
이한림
2018-02
The Graduate School, Ajou University
Development of highly efficient blue-emitting ZnSexTe1-x/ZnSe/ZnS quantum dots and their electroluminescence application
Park, Soowung;
Son, Chaeyeon;
Kang, Seokwoo;
Baek, Seungmin;
Kim, Yongjin;
Kwon, O. Pil
;
Park, Jongwook;
Kim, Sang Wook
2020-08-25
Journal of Industrial and Engineering Chemistry, Vol.88, pp.348-355
Korean Society of Industrial Engineering Chemistry
Energy-efficient VM opening algorithms for real-time workflows in heterogeneous clouds
Long, Saiqin;
Dai, Xin;
Pei, Tingrui;
Cao, Jiasheng;
Sekiya, Hiroo;
Choi, Young June
2022-04-28
Neurocomputing, Vol.483, pp.501-514
Elsevier B.V.
Combination Analysis and Switching Method of a Cascaded H-Bridge Multilevel Inverter Based on Transformers with the Different Turns Ratio for Increasing the Voltage Level
Lee, June Seok;
Sim, Hyun Woo;
Kim, Juyong;
Lee, Kyo Beum
2018-06-01
IEEE Transactions on Industrial Electronics, Vol.65, pp.4454-4465
Institute of Electrical and Electronics Engineers Inc.
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