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Showing results 1 to 10 of 162 (Search time: 0.0 seconds).

Mesoscopic Stacking Reconfigurations in Stacked van der Waals Filmoa mark
  • 2024-05-23
  • Small, Vol.20
  • John Wiley and Sons Inc
Impact of Stack Parameters on Modeled PM2.5 Conversion Rates: A Case Study of Chungnam during the KORUS-AQ 2016 굴뚝 제원에 따른 PM2.5 전환율 모사 비교: 2016 KORUS-AQ 기간 충남 사례oa mark
  • Ju, Hyeji;
  • Yoo, Chul;
  • Kim, Byeong Uk;
  • Kim, Hyun Cheol;
  • Kim, Soontae
  • 2019-10-01
  • Journal of Korean Society for Atmospheric Environment, Vol.35, pp.593-608
  • Korean Society for Atmospheric Environment
Thermally Induced Irreversible Disorder in Interlayer Stacking of γ-GeSeoa mark
  • Kim, Joonho;
  • Lee, Giyeok;
  • Lee, Sol;
  • Park, Jinsub;
  • Lee, Kihyun;
  • Jung, Joong Eon;
  • Lim, Seungjae;
  • Jang, Jeongsu;
  • Bae, Heesun;
  • Lee, Jae Ung;
  • Im, Seongil;
  • Soon, Aloysius;
  • Kim, Kwanpyo
  • 2024-12-27
  • Small, Vol.20
  • John Wiley and Sons Inc
Surface Passivation of Layered MoSe2 via van der Waals Stacking of Amorphous Hydrocarbon
  • Lee, Do Hyeon;
  • Dongquoc, Viet;
  • Hong, Seongin;
  • Kim, Seung Il;
  • Kim, Eunjeong;
  • Cho, Su yeon;
  • Oh, Chang Hwan;
  • Je, Yeonjin;
  • Kwon, Mi Ji;
  • Hoang Vo, Anh;
  • Seo, Dong Bum;
  • Lee, Jae Hyun;
  • Kim, Sunkook;
  • Kim, Eui Tae;
  • Park, Jun Hong
  • 2022-10-01
  • Small, Vol.18
  • John Wiley and Sons Inc
Ternary Logic Transistors Using Multi-Stacked 2D Electron Gas Channels in Ultrathin Oxide Heterostructuresoa mark
  • Choi, Ji Hyeon;
  • Seok, Tae Jun;
  • Kim, Sang June;
  • Dae, Kyun Seong;
  • Jang, Jae Hyuck;
  • Cho, Deok Yong;
  • Lee, Sang Woon;
  • Park, Tae Joo
  • 2025-02-10
  • Advanced Science, Vol.12
  • John Wiley and Sons Inc
Work-Function Variation and Delay Analysis in NAND and NOR Circuits using Gate Insulator Stack-based Dopingless Tunnel Field-effect Transistors
  • 2024-12-01
  • Journal of Semiconductor Technology and Science, Vol.24, pp.557-564
  • Institute of Electronics Engineers of Korea
Gamification effects on users' motivation to contribute knowledge in a Portuguese Q&A community
  • 2021-01-01
  • Aslib Journal of Information Management, Vol.73, pp.578-599
  • Emerald Group Holdings Ltd.
Graded crystalline HfO gate dielectric layer for high-k/Ge MOS gate stackoa mark
  • 2021-01-01
  • IEEE Journal of the Electron Devices Society, Vol.9, pp.295-299
  • Institute of Electrical and Electronics Engineers Inc.
Vertically Stacked vdW Double Heterojunction Photodiode with Ultrawide Bandgap Gallium Oxide Electron Reservoir
  • 2022-10-01
  • Advanced Optical Materials, Vol.10
  • John Wiley and Sons Inc
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