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to 10 of 125 (Search time: 0.0 seconds).
Optimizing De-Trap Pulses in Gate-Injection Type Ferroelectric NAND Cells to Minimize Read after Write Delay Issue
Kim, Giuk;
Choi, Hyojun;
Cho, Hongrae;
Lee, Sangho;
Shin, Hunbeom;
Kang, Hyunjun;
Kim, Hoon;
Shin, Seokjoong;
Park, Seonjae;
Kwon, Sunseong;
Lim, Youngjin;
Kim, Kang;
Min Chung, Jong;
Oh, Il Kwon
;
Ko Park, Sang Hee;
Ahn, Jinho;
Jeon, Sanghun
2024-01-01
IEEE Electron Device Letters, Vol.45, pp.2359-2362
Institute of Electrical and Electronics Engineers Inc.
An Effective Selection of Memory Technologies for TCAM to Improve the Search Operations: Demonstration of Memory Efficiency in SDN Recovery
oa mark
Alahmadi, Abdulhadi;
Chung, Tae Sun
2024-02-01
Electronics (Switzerland), Vol.13
Multidisciplinary Digital Publishing Institute (MDPI)
Crash Recovery Techniques for Flash Storage Devices Leveraging Flash Translation Layer: A Review
oa mark
Alahmadi, Abdulhadi;
Chung, Tae Sun
2023-03-01
Electronics (Switzerland), Vol.12
MDPI
A crash recovery scheme for a hybrid mapping FTL in nand flash storage devices
oa mark
Park, Jong Hyeok;
Park, Dong Joo;
Chung, Tae Sun
;
Lee, Sang Won
2021-02-01
Electronics (Switzerland), Vol.10, pp.1-20
MDPI AG
Data recovery aware garbage collection mechanism in flash-based storage devices
oa mark
Paik, Joon Young;
Jin, Rize;
Chung, Tae Sun
2018-09-01
IEICE Transactions on Information and Systems, Vol.E101D, pp.2404-2408
Institute of Electronics, Information and Communication, Engineers, IEICE
Probability-Based Static Wear-Leveling Algorithm for Block and Hybrid-Mapping NAND Flash Memory
Gudeta, Yared Hailu
2013-08
The Graduate School, Ajou University
Locality Competent Flash Translation Layer (LC-FTL) for NAND Flash Memory
Islam, A.B.M Rezbaul
2012-02
The Graduate School, Ajou University
효율적인 메모리 사용을 위한 LZCode 기반의 압축 기법
이현철
2012-02
The Graduate School, Ajou University
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Chung, Tae-Sun
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SEO, HYUNGTAK
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5
Jeon, Sanghun
5
Kim, Giuk
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Flash memory
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ferroelectric
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Flash Memory
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FTL
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flash memory
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Ferroelectricity
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메모리
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2020 - 2025
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Electronics (Basel)
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ACS Applied Materials and Interfaces
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IEEE Electron Device Letters
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