Ajou University repository

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Interface trap-induced temperature dependent hysteresis and mobility in β-Ga2O3 field-effect transistorsoa mark
  • 2021-02-01
  • Nanomaterials, Vol.11, pp.1-10
  • MDPI AG
Optimizing De-Trap Pulses in Gate-Injection Type Ferroelectric NAND Cells to Minimize Read after Write Delay Issue
  • Kim, Giuk;
  • Choi, Hyojun;
  • Cho, Hongrae;
  • Lee, Sangho;
  • Shin, Hunbeom;
  • Kang, Hyunjun;
  • Kim, Hoon;
  • Shin, Seokjoong;
  • Park, Seonjae;
  • Kwon, Sunseong;
  • Lim, Youngjin;
  • Kim, Kang;
  • Min Chung, Jong;
  • Oh, Il Kwon;
  • Ko Park, Sang Hee;
  • Ahn, Jinho;
  • Jeon, Sanghun
  • 2024-01-01
  • IEEE Electron Device Letters, Vol.45, pp.2359-2362
  • Institute of Electrical and Electronics Engineers Inc.
A comparative study of charge trapping effect in p-type MoTe2 and WSe2 FETs using pulsed current-voltage measurements
  • Yang, Jeong Yong;
  • Lee, Chan Ho;
  • Oh, Young Taek;
  • Ma, Jiyeon;
  • Heo, Junseok;
  • Yoo, Geonwook
  • 2021-01-01
  • Japanese Journal of Applied Physics, Vol.60
  • IOP Publishing Ltd
Sub-nanosecond terahertz radiation obtained with an aperiodically poled lithium niobate and organic HMQ-TMSoa mark
  • Lee, Seung Heon;
  • Kwon, O. Pil;
  • Carrillo-Fuentes, Miriam;
  • Cudney, Roger S.
  • 2020-08-17
  • Optics Express, Vol.28, pp.24444-24451
  • OSA - The Optical Society
코로나 방전의 탈질 특성에 관한 연구
  • 장홍기
  • 2008-08
  • The Graduate School, Ajou University
Enhanced photoactivity towards bismuth vanadate water splitting through tantalum doping: An experimental and density functional theory study
  • Kalanur, Shankara S.;
  • Jae Lee, Young;
  • Seo, Hyungtak;
  • Pollet, Bruno G.
  • 2023-11-15
  • Journal of Colloid and Interface Science, Vol.650, pp.94-104
  • Academic Press Inc.
초광대역 임펄스 라디오를 위한 CMOS 펄스발생기
  • 김원종
  • 2014-08
  • The Graduate School, Ajou University
가변 채널 대역폭 초광대역 라디오 CMOS가우시안 펄스 발생기
  • 최재민
  • 2015-08
  • The Graduate School, Ajou University
Design of a Small NEMP Simulator for the Immunity Test of Core Electronic Components in HEMP Environmentsoa mark
  • 2020-01-01
  • IEEE Access, Vol.8, pp.217773-217780
  • Institute of Electrical and Electronics Engineers Inc.
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