Ajou University repository

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Showing results 1 to 10 of 3434 (Search time: 0.156 seconds).

Lifetime estimation for optocouplers using accelerated degradation test
  • Kang, Minkoo;
  • Lee, Sunjae;
  • Park, Heedo;
  • Jang, Joongsoon;
  • Park, Sangchul;
  • Kim, Jong Ho;
  • Yoo, Chan Sei
  • 2022-02-01
  • Quality and Reliability Engineering International, Vol.38, pp.560-573
  • John Wiley and Sons Ltd
Remaining useful life estimation using accelerated degradation test, a gamma process, and the arrhenius model for nuclear power plants
  • Kang, Minkoo;
  • Lee, Sunjae;
  • Kim, Jong Ho;
  • Yoo, Chan Sei;
  • Jang, Joongsoon;
  • Negatu, Belachew Mekbibe;
  • Park, Sangchul
  • 2022-10-01
  • Journal of Mechanical Science and Technology, Vol.36, pp.4905-4912
  • Korean Society of Mechanical Engineers
패키지 고장 메커니즘 기반의 고출력 백색 LED 가속수명시험
  • 천성일
  • 2011-02
  • The Graduate School, Ajou University
OLED 디스플레이의 가속인자와 시험시간
  • 유지선
  • 2018-02
  • The Graduate School, Ajou University
열화량 기반의 LED 가속수명시험 분석
  • 김승환
  • 2017-08
  • The Graduate School, Ajou University
Development of Accelerated Test Method to Evaluate the Long-Term Thermal Performance of Fumed-Silica Vacuum Insulation Panels Using Accelerated Conditionsoa mark
  • 2023-10-01
  • Materials, Vol.16
  • Multidisciplinary Digital Publishing Institute (MDPI)
An Efficient Test Architecture Using Hybrid Built-In Self-Test for Processing-in-Memory
  • 2024-01-01
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • Institute of Electrical and Electronics Engineers Inc.
A Robust Test Architecture for Low-Power AI Accelerators
  • 2024-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Institute of Electrical and Electronics Engineers Inc.
엄격한 고장판정기준을 적용한 단계별 열화시험 설계
  • 장성진
  • 2005
  • The Graduate School, Ajou University
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