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Dual image deblurring using deep image prioroa mark
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Publication Year
2021-09-01
Publisher
MDPI AG
Citation
Electronics (Switzerland), Vol.10
Keyword
Blur kernel estimationDeblurringDeep image priorDeep learning
All Science Classification Codes (ASJC)
Control and Systems EngineeringSignal ProcessingHardware and ArchitectureComputer Networks and CommunicationsElectrical and Electronic Engineering
Abstract
Blind image deblurring, one of the main problems in image restoration, is a challenging, ill-posed problem. Hence, it is important to design a prior to solve it. Recently, deep image prior (DIP) has shown that convolutional neural networks (CNNs) can be a powerful prior for a single natural image. Previous DIP-based deblurring methods exploited CNNs as a prior when solving the blind deburring problem and performed remarkably well. However, these methods do not completely utilize the given multiple blurry images, and have limitations of performance for severely blurred images. This is because their architectures are strictly designed to utilize a single image. In this paper, we propose a method called DualDeblur, which uses dual blurry images to generate a single sharp image. DualDeblur jointly utilizes the complementary information of multiple blurry images to capture image statistics for a single sharp image. Additionally, we propose an adaptive L2_SSIM loss that enhances both pixel accuracy and structural properties. Extensive experiments show the superior performance of our method to previous methods in both qualitative and quantitative evaluations.
ISSN
2079-9292
Language
eng
URI
https://dspace.ajou.ac.kr/dev/handle/2018.oak/32228
DOI
https://doi.org/10.3390/electronics10172045
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Type
Article
Funding
Funding: This work was supported in part by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. 2019R1C1C1007446), and in part by the BK21 FOUR program of the National Research Foundation of Korea funded by the Ministry of Education (NRF5199991014091).
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Heo,Yong Seok  Image
Heo,Yong Seok 허용석
Department of Electrical and Computer Engineering
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