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Mobile AMOLED Display Power Model Considering I-R Drop in Smartphones
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Publication Year
2021-03-01
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
IEEE Transactions on Industrial Electronics, Vol.68, pp.2694-2702
Keyword
AMOLED displayI-R droppower model
Mesh Keyword
Conventional powerDisplay panelsImage databaseLarge currentPower consumedPower modelSamsungVoltage drop
All Science Classification Codes (ASJC)
Control and Systems EngineeringElectrical and Electronic Engineering
Abstract
In order to efficiently manage display power, there is a need for a system that can accurately predict the power consumed according to the displayed image. Existing AMOLED display power models do not consider the effects of I-R drop, which is a voltage drop along the VDD line. Therefore, when the existing power model is applied to a recent AMOLED display panel, which has a large physical size and uses a large current, power consumption cannot be accurately predicted. In this article, we propose a new model to compensate for the I-R drop and present a more accurate method for predicting AMOLED display power consumption by applying it to existing AMOLED display power models. To verify this, we conducted extensive experiments for various image databases on AMOLED display panels of Samsung Galaxy S7 and S9. When comparing the proposed display power model connected with the I-R drop model with conventional power models, it is confirmed that the proposed power model improves the accuracy by up to 70.3% over them.
Language
eng
URI
https://dspace.ajou.ac.kr/dev/handle/2018.oak/31704
DOI
https://doi.org/10.1109/tie.2020.2973887
Fulltext

Type
Article
Funding
Manuscript received August 30, 2019; revised December 15, 2019 and January 14, 2020; accepted January 24, 2020. Date of publication February 20, 2020; date of current version November 18, 2020. This work was supported by the National Research Foundation of Korea Grant funded by the Korea government (MSIT) under Grant 2018R1A2B6005466. (Corresponding author: Young-Jin Kim.) The authors are with the Department of Electrical and Computer Engineering, Ajou University, Suwon 16499, South Korea (e-mail: hehehe@ajou.ac.kr; tak5868@ajou.ac.kr; youngkim@ajou.ac.kr). Color versions of one or more of the figures in this article are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TIE.2020.2973887
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