Ajou University repository

Quantitative analysis of insulator degradation in a single layer solenoid by renormalization of the transmission parameteroa mark
Citations

SCOPUS

0

Citation Export

Publication Year
2020-11-01
Publisher
MDPI AG
Citation
Electronics (Switzerland), Vol.9, pp.1-14
Keyword
Diagnostic methodScattering parameter renormalizationSingle layer solenoidTransmission line theory
All Science Classification Codes (ASJC)
Control and Systems EngineeringSignal ProcessingHardware and ArchitectureComputer Networks and CommunicationsElectrical and Electronic Engineering
Abstract
In this paper, a novel method to quantitatively analyze insulator degradation in a single layer solenoid is proposed. The suggested method employs renormalization of scattering parameters to efficiently detect changes of permittivity in a degraded solenoid. Firstly, a transmission line model, including a locally degraded part in the insulator, was developed, and it was determined that the phase information of the transmission parameter was very informative to check the permittivity change in the transmission line. To check the workability of this idea in a solenoid, a 30-turn single-layer solenoid was designed and fabricated, and 51 degraded states for mimicking insulation deterioration in each turn were introduced by installing additional insulator rings, which increased local relative permittivity. The phase data of the measured transmission parameter turned out to be useful for quantifying changes of the insulator in the solenoid. To maximize the detectability, the measured scattering parameters were renormalized with different reference impedances, which was very useful for detecting degradation in the transmission parameter. In this paper, detailed procedures for quantitatively analyzing degradation of an insulator are proposed and we verify that the suggested renormalization technique is very promising for effectively evaluating the degradation of a solenoid.
ISSN
2079-9292
Language
eng
URI
https://dspace.ajou.ac.kr/dev/handle/2018.oak/31683
DOI
https://doi.org/10.3390/electronics9111984
Fulltext

Type
Article
Funding
Funding: This work was supported by the Nuclear Safety Research Program through the Korea Foundation of Nuclear Safety (KoFONS) using the financial resource granted by the Nuclear Safety and Security Commission (NSSC) of the Republic of Korea (no. 1805007).
Show full item record

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Chai, Jang Bom Image
Chai, Jang Bom채장범
Department of Mechanical Engineering
Read More

Total Views & Downloads

File Download

  • There are no files associated with this item.