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SRBML: A Single-Event-Upset Recoverable and BTI-Mitigated Latch Design for Long-Term Reliability Enhancement
  • Xia, Fan;
  • Zhang, Jing;
  • Ali, Jehad;
  • Zhang, Chunjiong;
  • Wen, Xiaoqing;
  • Yan, Aibin
  • 2024-01-01
  • Proceedings - ITC-Asia 2024: 8th IEEE International Test Conference in Asia
  • Institute of Electrical and Electronics Engineers Inc.
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