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SHRCO: Design of an SRAM with High Reliability and Cost Optimization for Safety-Critical Applications
  • Chang, Yang;
  • Liu, Guangzhu;
  • Ullah, Inam;
  • Shan, Gaoyang;
  • Wen, Xiaoqing;
  • Yan, Aibin
  • 2024-01-01
  • Proceedings - ITC-Asia 2024: 8th IEEE International Test Conference in Asia
  • Institute of Electrical and Electronics Engineers Inc.
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