JCR2021-2023
SJR2022-2023
CiteScore2020-2023
SCIE2021-2024
CC2021-2024
SCOPUS2021-2024
DOAJ2019-2024
| OA | oa mark |
|---|---|
| Keywords | extreme manufacturing, micro/nano metrology, ultrahigh precision manufacturing, complex systems, materials science, atomic level control |
| Review Process | Anonymous peer review |
| Journal info. pages |
|
| Licences | CC BY |
| Copyrights | Yes |
| DOAJ Coverage | Added on Date : 2019-07-31T14:14:03Z |
| Subject(s) | Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials | Technology: Technology (General): Industrial engineering. Management engineering | Science: Physics |
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