Ajou University repository

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
ISSN
  • E1937-4151
  • P0278-0070
Publisher

Institute of Electrical and Electronics Engineers

Listed on
(Coverage)

JCR1997-2023

SJR1999-2020;2022-2023

CiteScore2011-2023

SCI2010-2019

SCIE2010-2024

CC2016-2024

SCOPUS2017-2024

Active
Active

based on the information

  • SCOPUS:2024-10
Country
USA
Aime & Scopes
The purpose of this Transactions is to publish papers of interest to individuals in the area of computer-aided design of integrated circuits and systems composed of analog, digital, mixed-signal, optical, or microwave components. The aids include methods, models, algorithms, and man-machine interfaces for system-level, physical and logical design including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, hardware-software co-design and documentation of integrated circuit and system designs of all complexities. Design tools and techniques for evaluating and designing integrated circuits and systems for metrics such as performance, power, reliability, testability, and security are a focus.
Homepage
https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43 
Article List

Showing results 1 to 4 of 4

A New Pipelined Output Data Reducer of BOST for Improved Parallelism
  • 2025-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.44 No.2, pp.765-776
  • Institute of Electrical and Electronics Engineers Inc.
A Novel CNN-Based Redundancy Analysis Using Parallel Solution Decision
  • Shin, Seung Ho;
  • Cheong, Minho;
  • Lee, Hayoung;
  • Kim, Byungsoo;
  • Kang, Sungho
  • 2025-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Institute of Electrical and Electronics Engineers Inc.
A Robust Test Architecture for Low-Power AI Accelerators
  • 2024-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Institute of Electrical and Electronics Engineers Inc.
A Built-In Self-Repair With Maximum Fault Collection and Fast Analysis Method for HBM
  • Yoon, Joonsik;
  • Lee, Hayoung;
  • Moon, Youngki;
  • Shin, Seung Ho;
  • Kang, Sungho
  • 2024-01-01
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Institute of Electrical and Electronics Engineers Inc.
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