Citation Export
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Gao, Zhongyu | - |
| dc.contributor.author | Yan, Aibin | - |
| dc.contributor.author | Huang, Zhengfeng | - |
| dc.contributor.author | Cui, Jie | - |
| dc.contributor.author | Roh, Byeong Hee | - |
| dc.contributor.author | Liu, Guangzhu | - |
| dc.contributor.author | Girard, Patrick | - |
| dc.contributor.author | Wen, Xiaoqing | - |
| dc.date.issued | 2025-01-01 | - |
| dc.identifier.issn | 2327-4662 | - |
| dc.identifier.uri | https://aurora.ajou.ac.kr/handle/2018.oak/38542 | - |
| dc.identifier.uri | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=86000443157&origin=inward | - |
| dc.description.abstract | Building an interpretable fault detection and diagnostic model based on few-shot circuit samples and prior information about circuit structures is of significant importance. To fill these gaps, we propose a graph-based multi-task transfer learning method for fault detection and diagnosis of circuits under few-shot conditions. Firstly, in order to model the interconnections of nodes in a circuit, the sample data is organized into a graph-structure, and a semi-supervised graph-based structural feature fusion method is proposed. The proposed method can accept graph-structured data and process the data using feature fusion methods. Secondly, to improve the model performance under few-shot conditions, two transfer learning mechanisms are proposed for the topological structure characteristics of analog circuits as well as circuit signal characteristics. Finally, through parameter-shared strategy, we propose a task transfer-based fault diagnosis approach. Experimental results on three different circuits show that the proposed method has the best diagnostic accuracy compared to typical detection and diagnosis schemes. | - |
| dc.language.iso | eng | - |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
| dc.subject.mesh | Condition | - |
| dc.subject.mesh | Fault detection and diagnosis | - |
| dc.subject.mesh | Faults detection | - |
| dc.subject.mesh | Faults diagnosis | - |
| dc.subject.mesh | Feature fusion method | - |
| dc.subject.mesh | Graph attention | - |
| dc.subject.mesh | Graph-based | - |
| dc.subject.mesh | Multi tasks | - |
| dc.subject.mesh | Task transfer | - |
| dc.subject.mesh | Transfer learning | - |
| dc.title | Graph-Based Multi-Task Transfer Learning for Fault Detection and Diagnosis of Few-Shot Analog Circuits | - |
| dc.type | Article | - |
| dc.citation.title | IEEE Internet of Things Journal | - |
| dc.identifier.bibliographicCitation | IEEE Internet of Things Journal | - |
| dc.identifier.doi | 10.1109/jiot.2025.3547957 | - |
| dc.identifier.scopusid | 2-s2.0-86000443157 | - |
| dc.identifier.url | http://ieeexplore.ieee.org/servlet/opac?punumber=6488907 | - |
| dc.subject.keyword | analog circuits | - |
| dc.subject.keyword | Fault detection | - |
| dc.subject.keyword | fault diagnosis | - |
| dc.subject.keyword | graph attention | - |
| dc.subject.keyword | transfer learning | - |
| dc.type.other | Article | - |
| dc.identifier.pissn | 23274662 | - |
| dc.description.isoa | false | - |
| dc.subject.subarea | Signal Processing | - |
| dc.subject.subarea | Information Systems | - |
| dc.subject.subarea | Hardware and Architecture | - |
| dc.subject.subarea | Computer Science Applications | - |
| dc.subject.subarea | Computer Networks and Communications | - |
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