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Deep Learning-Based SBOM Defect Detection for Medical Devices
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dc.contributor.authorKim, Heeyeon-
dc.contributor.authorKim, Ki Hyung-
dc.date.issued2024-01-01-
dc.identifier.urihttps://aurora.ajou.ac.kr/handle/2018.oak/37125-
dc.identifier.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85189940927&origin=inward-
dc.description.abstractThis paper focuses on the digital innovation brought about by the advancement of ICT technology in the healthcare field. In particular, the introduction of cutting-edge technologies such as AI are contributing to the improvement of health care services, but at the same time, the risk of cybersecurity threats and software security problems in medical devices are emerging as well. Therefore, the importance of SBOM (Software Bill of Materials) to respond to such problems has now been emphasized, and this paper focuses on strengthening the cybersecurity of medical devices through the creation and application of SBOM. This study develops an AI-based software defect detection method and seeks to ensure the reliability and safety of medical devices by proposing an efficient method compared to existing rule-based approaches. This study aims to contribute to strengthening security by detecting flaws in medical devices through AI and establishing a technical foundation for providing ultimate quality healthcare services.-
dc.description.sponsorshipThis research was supported in part by the MSIT (Ministry of Science and ICT), Korea, under the ITRC (Information Technology Research Center) support program (IITP-2024-2021-0-01835)-
dc.language.isoeng-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.subject.meshArtificial intelligence-
dc.subject.meshBill of materials-
dc.subject.meshCyber security-
dc.subject.meshDeep learning-
dc.subject.meshDefect detection-
dc.subject.meshHealthcare services-
dc.subject.meshMaterial defect detection-
dc.subject.meshMedical Devices-
dc.subject.meshSoft-ware defect detection-
dc.subject.meshSoftware bill of material-
dc.titleDeep Learning-Based SBOM Defect Detection for Medical Devices-
dc.typeConference-
dc.citation.conferenceDate2024.2.19. ~ 2024.2.22.-
dc.citation.conferenceName6th International Conference on Artificial Intelligence in Information and Communication, ICAIIC 2024-
dc.citation.edition6th International Conference on Artificial Intelligence in Information and Communication, ICAIIC 2024-
dc.citation.endPage51-
dc.citation.startPage47-
dc.citation.title6th International Conference on Artificial Intelligence in Information and Communication, ICAIIC 2024-
dc.identifier.bibliographicCitation6th International Conference on Artificial Intelligence in Information and Communication, ICAIIC 2024, pp.47-51-
dc.identifier.doi10.1109/icaiic60209.2024.10463483-
dc.identifier.scopusid2-s2.0-85189940927-
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=10463165-
dc.subject.keywordArtificial Intelligence (AI)-
dc.subject.keywordCybersecurity-
dc.subject.keywordDeep Learning-
dc.subject.keywordMedical Device-
dc.subject.keywordSBOM-
dc.subject.keywordSoft-ware Defect Detection-
dc.type.otherConference Paper-
dc.description.isoafalse-
dc.subject.subareaArtificial Intelligence-
dc.subject.subareaComputer Networks and Communications-
dc.subject.subareaComputer Science Applications-
dc.subject.subareaComputer Vision and Pattern Recognition-
dc.subject.subareaInformation Systems-
dc.subject.subareaSafety, Risk, Reliability and Quality-
dc.subject.subareaHealth Informatics-
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