Citation Export
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Young Jin | - |
| dc.contributor.author | Jeong, Young Kyung | - |
| dc.contributor.author | Youn, Dong Gi | - |
| dc.contributor.author | Park, Hyun Ho | - |
| dc.contributor.author | Park, Yong Bae | - |
| dc.date.issued | 2020-01-01 | - |
| dc.identifier.issn | 2169-3536 | - |
| dc.identifier.uri | https://aurora.ajou.ac.kr/handle/2018.oak/31717 | - |
| dc.identifier.uri | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85097741068&origin=inward | - |
| dc.description.abstract | We design a small nuclear electromagnetic pulse (NEMP) simulator to study the immunity of core electronic components in high-altitude electro-magnetic pulse (HEMP) environments. The NEMP simulator comprises of a power device, a high-voltage charging part, a pulse-shaping part, and the input taper. The performance of the proposed simulator is verified by the actual experimental results. The positive and negative polarities for the mono pulse output of a transient pulse generator are checked against the standard. The field uniformity of the proposed NEMP simulator is 1.6 dB and fully meets the standard. | - |
| dc.description.sponsorship | This work was supported in part by the Ministry of Science and ICT (MSIT), South Korea, through the Information Technology Research Center (ITRC) Support Program supervised by the Institute for Information and Communications Technology Promotion (IITP) under Grant IITP-2020-2018-0-01424. | - |
| dc.language.iso | eng | - |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
| dc.subject.mesh | Electronic component | - |
| dc.subject.mesh | Field uniformity | - |
| dc.subject.mesh | Immunity test | - |
| dc.subject.mesh | Magnetic pulse | - |
| dc.subject.mesh | Negative polarity | - |
| dc.subject.mesh | Nuclear electromagnetic pulse | - |
| dc.subject.mesh | Power devices | - |
| dc.subject.mesh | Transient pulse | - |
| dc.title | Design of a Small NEMP Simulator for the Immunity Test of Core Electronic Components in HEMP Environments | - |
| dc.type | Article | - |
| dc.citation.endPage | 217780 | - |
| dc.citation.startPage | 217773 | - |
| dc.citation.title | IEEE Access | - |
| dc.citation.volume | 8 | - |
| dc.identifier.bibliographicCitation | IEEE Access, Vol.8, pp.217773-217780 | - |
| dc.identifier.doi | 2-s2.0-85097741068 | - |
| dc.identifier.scopusid | 2-s2.0-85097741068 | - |
| dc.identifier.url | http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639 | - |
| dc.subject.keyword | field uniformity | - |
| dc.subject.keyword | guided-wave electromagnetic pulse simulator | - |
| dc.subject.keyword | high-altitude electromagnetic pulse | - |
| dc.subject.keyword | Nuclear electromagnetic pulse | - |
| dc.type.other | Article | - |
| dc.description.isoa | true | - |
| dc.subject.subarea | Computer Science (all) | - |
| dc.subject.subarea | Materials Science (all) | - |
| dc.subject.subarea | Engineering (all) | - |
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