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Growth of NbC thin film using CH4 as a carbon source and reducing agentoa mark
  • Kim, Kwan Woo ;
  • Kim, Bum Jun ;
  • Lee, Sang Hoon ;
  • Nasir, Tuqeer ;
  • Lim, Hyung Kyu ;
  • Choi, Ik Jun ;
  • Jeong, Byung Joo ;
  • Lee, Jaeyeong ;
  • Yu, Hak Ki ;
  • Choi, Jae Young
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dc.contributor.authorKim, Kwan Woo-
dc.contributor.authorKim, Bum Jun-
dc.contributor.authorLee, Sang Hoon-
dc.contributor.authorNasir, Tuqeer-
dc.contributor.authorLim, Hyung Kyu-
dc.contributor.authorChoi, Ik Jun-
dc.contributor.authorJeong, Byung Joo-
dc.contributor.authorLee, Jaeyeong-
dc.contributor.authorYu, Hak Ki-
dc.contributor.authorChoi, Jae Young-
dc.date.issued2018-01-01-
dc.identifier.issn2079-6412-
dc.identifier.urihttps://aurora.ajou.ac.kr/handle/2018.oak/30831-
dc.identifier.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85069768838&origin=inward-
dc.description.abstractTransition metal carbides (TMCs) have high melting points, hardness, and chemical stabilities in acidic media. In this work, a chemical vapor deposition method using CH4 as a carbon source and reducing agent was employed to make an NbC film. NbCl5 carried by Ar gas was used as an Nb precursor. An NbC thin film, deposited on a c-plane sapphire, exhibited a preferential orientation of the (111) plane, which can be explained by domain-matching epitaxy. A nanoindentation test showed that the NbC film with the preferential orientation of the (111) plane was stronger than that with a random orientation. Moreover, the results showed that H2, which is conventionally used as a reducing agent in NbC synthesis, degraded the crystallinity and hardness of the fabricated NbC.-
dc.description.sponsorshipFunding: This research was supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF), funded by the Ministry of Education, Science, and Technology [NRF-2018R1D1A1B07050253].-
dc.language.isoeng-
dc.publisherMDPI AG-
dc.titleGrowth of NbC thin film using CH4 as a carbon source and reducing agent-
dc.typeArticle-
dc.citation.number11-
dc.citation.titleCoatings-
dc.citation.volume8-
dc.identifier.bibliographicCitationCoatings, Vol.8 No.11-
dc.identifier.doi10.3390/coatings8110379-
dc.identifier.scopusid2-s2.0-85069768838-
dc.identifier.urlhttps://res.mdpi.com/coatings/coatings-08-00379/article_deploy/coatings-08-00379.pdf?filename=&attachment=1-
dc.subject.keywordC-plane sapphire-
dc.subject.keywordChemical vapor deposition (CVD)-
dc.subject.keywordNbC film-
dc.subject.keywordPreferential orientation-
dc.subject.keyworddomain matching epitaxy (DME)-
dc.subject.keywordReducing agent-
dc.subject.keywordTransition metal carbides (TMCs)-
dc.type.otherArticle-
dc.description.isoatrue-
dc.subject.subareaSurfaces and Interfaces-
dc.subject.subareaSurfaces, Coatings and Films-
dc.subject.subareaMaterials Chemistry-
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