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Work-Function Variation and Delay Analysis in NAND and NOR Circuits using Gate Insulator Stack-based Dopingless Tunnel Field-effect Transistors
Lee, Jongmin
;
Kim, Jang Hyun
2024-12-01
Journal of Semiconductor Technology and Science, Vol.24, pp.557-564
Institute of Electronics Engineers of Korea
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Kim, Jang Hyun
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Lee, Jongmin
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2020 - 2025
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JOURNAL OF SEMICONDUCTOR TECHNOLO...
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