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to 10 of 2020 (Search time: 0.0 seconds).
Electronic band alignment in AlGaN/GaN high electron-mobility transistors investigated using scanning photocurrent microscopy
Kim, Y. C.;
Son, B. H.;
Jeong, H. Y.;
Park, K. H.;
Ahn, Y. H.
2019-04-01
Current Applied Physics, Vol.19, pp.406-410
Elsevier B.V.
Influence of UV/Ozone Treatment on Threshold Voltage Modulation in Sol–Gel IGZO Thin-Film Transistors
Kim, Wonsik;
Lee, Won June;
Kwak, Taehyun;
Baek, Seokhyeon;
Lee, Seung Hoon;
Park, Sungjun
2022-04-01
Advanced Materials Interfaces, Vol.9
John Wiley and Sons Inc
Improvement of Thermal Characteristics and On-Current in Vertically Stacked Nanosheet FET by Parasitic Channel Height Engineering
oa mark
Song, Young Suh;
Kim, Hyunwoo;
Kim, Jang Hyun
2024-01-01
IEEE Access, Vol.12, pp.105878-105886
Institute of Electrical and Electronics Engineers Inc.
Ternary Logic Transistors Using Multi-Stacked 2D Electron Gas Channels in Ultrathin Oxide Heterostructures
oa mark
Choi, Ji Hyeon;
Seok, Tae Jun;
Kim, Sang June;
Dae, Kyun Seong;
Jang, Jae Hyuck;
Cho, Deok Yong;
Lee, Sang Woon
;
Park, Tae Joo
2025-02-10
Advanced Science, Vol.12
John Wiley and Sons Inc
Analysis of thermal effects according to channel and drain contact metal distance
oa mark
An, Do Gyun;
Lim, Un Hyun;
Song, Young Suh;
Kim, Hyunwoo;
Kim, Jang Hyun
2025-01-01
Case Studies in Thermal Engineering, Vol.65
Elsevier Ltd
Reconfigurable Radio-Frequency High-Electron Mobility Transistors via Ferroelectric-Based Gallium Nitride Heterostructure
Yang, Jeong Yong;
Yeom, Min Jae;
Lee, Jaeyong;
Lee, Kyusang;
Park, Changkun;
Heo, Junseok
;
Yoo, Geonwook
2022-09-01
Advanced Electronic Materials, Vol.8
John Wiley and Sons Inc
유기물 반도체 Pentacene에서 전자와 정공의 전도 특성 연구
임상빈
2005
The Graduate School, Ajou University
1D van der Waals Nb2Pd3Se8-Based n-Type Field-Effect Transistors Prepared by Liquid Phase Exfoliation
Choi, Kyung Hwan;
Jeon, Jiho;
Jeong, Byung Joo;
Chae, Sudong;
Oh, Seungbae;
Woo, Chaeheon;
Kim, Tae Yeong;
Ahn, Jungyoon;
Lee, Jae Hyun;
Yu, Hak Ki
;
Choi, Jae Young
2022-07-01
Advanced Materials Interfaces, Vol.9
John Wiley and Sons Inc
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24
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23
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22
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20
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