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Showing results 1 to 10 of 1966 (Search time: 0.0 seconds).

Significant control of metal-insulator transition temperature through catalytic excessive oxygen doping in high-performance vanadium dioxide nanobeam channel
  • 2020-05-01
  • Journal of Materials Science and Technology, Vol.44, pp.96-101
  • Chinese Society of Metals
Interface and bulk engineering of VO2 thin film deposited on Si for multi-level metal-to-insulator transitions
  • 2023-02-15
  • Applied Surface Science, Vol.611
  • Elsevier B.V.
Surface hydrogeneration of vanadium dioxide nanobeam to manipulate insulator-to-metal transition using hydrogen plasmaoa mark
  • 2021-01-01
  • Journal of Asian Ceramic Societies
  • Taylor and Francis Ltd.
Recent Progress on Low-Temperature Selective Catalytic Reduction of NOx with Ammoniaoa mark
  • 2024-09-01
  • Molecules, Vol.29
  • Multidisciplinary Digital Publishing Institute (MDPI)
Strain effects on insulator-to-metal transition and electronic structure in VO2
  • Sahu, S. R.;
  • Majid, S. S.;
  • Tripathy, A.;
  • Bano, N.;
  • Ahad, A.;
  • Lee, Hyungwoo;
  • Sathe, V. G.;
  • Shukla, D. K.
  • 2024-04-15
  • Physical Review B, Vol.109
  • American Physical Society
Electric field-triggered metal-insulator transition resistive switching of bilayered multiphasic VOx
  • Won, Seokjae;
  • Lee, Sang Yeon;
  • Hwang, Jungyeon;
  • Park, Jucheol;
  • Seo, Hyungtak
  • 2018-01-01
  • Electronic Materials Letters, Vol.14, pp.14-22
  • The Korean Institute of Metals and Materials
Room temperature deposited highly conductive HfNx films for high-performance HfN/Si junction diodes
  • 2024-10-01
  • Surfaces and Interfaces, Vol.53
  • Elsevier B.V.
Enabling double mott transitions at high temperatures in Ti–VOx formed by proximity-oxidation for neuromorphic image recognition based on CNN-LeNet
  • Iqbal, Shahid;
  • Kumar, Mohit;
  • Safder, Usman;
  • Ali, Rana Basit;
  • Sial, Qadeer Akbar;
  • Khan, Amir Sohail;
  • Kim, Junmo;
  • Lee, Jinchan;
  • Seo, Hyungtak
  • 2025-01-01
  • Surfaces and Interfaces, Vol.56
  • Elsevier B.V.
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