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to 10 of 539 (Search time: 0.0 seconds).
Positive Interaction between Charge Trapping and Polarization Switching in Metal-Interlayer-Ferroelectric-Interlayer-Silicon (MIFIS) Ferroelectric Field-Effect Transistor
Choi, Hyojun;
Kim, Giuk;
Lee, Sangho;
Shin, Hunbeom;
Lim, Youngjin;
Kim, Kang;
Kim, Do Hyung;
Oh, Il Kwon
;
Park, Sang Hee Ko;
Ahn, Jinho;
Jeon, Sanghun
2024-01-01
IEEE Electron Device Letters, Vol.45, pp.2351-2354
Institute of Electrical and Electronics Engineers Inc.
Experimental Analysis on the Interaction Between Interface Trap Charges and Polarization on the Memory Window of Metal-Ferroelectric-Insulator-Si (MFIS) FeFET
Kim, Giuk;
Choi, Hyojun;
Lee, Sangho;
Shin, Hunbeom;
Lee, Sangmok;
Nam, Yunseok;
Kang, Hyunjun;
Shin, Seokjoong;
Kim, Hoon;
Lim, Youngjin;
Kim, Kang;
Oh, Il Kwon
;
Ko Park, Sang Hee;
Ahn, Jinho;
Jeon, Sanghun
2024-01-01
IEEE Transactions on Electron Devices, Vol.71, pp.6627-6632
Institute of Electrical and Electronics Engineers Inc.
소프트웨어 실시간 무결성 인증 방법 실험 및 구현
김용복
2014-08
The Graduate School, Ajou University
Ultrahigh-Speed Near-Infrared Electrodynamic Solid-State Trans-Memory
Kumar, Mohit
;
Seo, Hyungtak
2022-06-28
ACS Applied Electronic Materials, Vol.4, pp.2906-2914
American Chemical Society
공간 지연과제 수행 중 전전두피질 집단신경신호의 정보 디코딩
김지은
2006-02
The Graduate School, Ajou University
Adaptive-Sliding-Window-Based Detection for Noncooperative Spectrum Sensing in Radar Band
Noh, Jiyoon;
Kwon, Yohan;
Lee, Juhyung;
Baek, Hoki;
Lim, Jaesung
2022-09-01
IEEE Systems Journal, Vol.16, pp.3878-3881
Institute of Electrical and Electronics Engineers Inc.
Ion Beam-Mediated Defect Engineering in TiOxThin Films for Controlled Resistive Switching Property and Application
Hasina, Dilruba;
Kumar, Mohit
;
Singh, Ranveer;
Mollick, Safiul Alam;
Mitra, Anirban;
Srivastava, Sanjeev Kumar;
Luong, Minh Anh;
Som, Tapobrata
2021-09-28
ACS Applied Electronic Materials, Vol.3, pp.3804-3814
American Chemical Society
컴퓨터의 하드디스크 부팅속도 비교평가
이세진
2008-08
The Graduate School, Ajou University
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7
Iqbal, Shahid
7
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