Ajou University repository

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Showing results 1 to 10 of 539 (Search time: 0.0 seconds).

Positive Interaction between Charge Trapping and Polarization Switching in Metal-Interlayer-Ferroelectric-Interlayer-Silicon (MIFIS) Ferroelectric Field-Effect Transistor
  • Choi, Hyojun;
  • Kim, Giuk;
  • Lee, Sangho;
  • Shin, Hunbeom;
  • Lim, Youngjin;
  • Kim, Kang;
  • Kim, Do Hyung;
  • Oh, Il Kwon;
  • Park, Sang Hee Ko;
  • Ahn, Jinho;
  • Jeon, Sanghun
  • 2024-01-01
  • IEEE Electron Device Letters, Vol.45, pp.2351-2354
  • Institute of Electrical and Electronics Engineers Inc.
Experimental Analysis on the Interaction Between Interface Trap Charges and Polarization on the Memory Window of Metal-Ferroelectric-Insulator-Si (MFIS) FeFET
  • Kim, Giuk;
  • Choi, Hyojun;
  • Lee, Sangho;
  • Shin, Hunbeom;
  • Lee, Sangmok;
  • Nam, Yunseok;
  • Kang, Hyunjun;
  • Shin, Seokjoong;
  • Kim, Hoon;
  • Lim, Youngjin;
  • Kim, Kang;
  • Oh, Il Kwon;
  • Ko Park, Sang Hee;
  • Ahn, Jinho;
  • Jeon, Sanghun
  • 2024-01-01
  • IEEE Transactions on Electron Devices, Vol.71, pp.6627-6632
  • Institute of Electrical and Electronics Engineers Inc.
소프트웨어 실시간 무결성 인증 방법 실험 및 구현
  • 김용복
  • 2014-08
  • The Graduate School, Ajou University
Ultrahigh-Speed Near-Infrared Electrodynamic Solid-State Trans-Memory
  • 2022-06-28
  • ACS Applied Electronic Materials, Vol.4, pp.2906-2914
  • American Chemical Society
Adaptive-Sliding-Window-Based Detection for Noncooperative Spectrum Sensing in Radar Band
  • Noh, Jiyoon;
  • Kwon, Yohan;
  • Lee, Juhyung;
  • Baek, Hoki;
  • Lim, Jaesung
  • 2022-09-01
  • IEEE Systems Journal, Vol.16, pp.3878-3881
  • Institute of Electrical and Electronics Engineers Inc.
Ion Beam-Mediated Defect Engineering in TiOxThin Films for Controlled Resistive Switching Property and Application
  • Hasina, Dilruba;
  • Kumar, Mohit;
  • Singh, Ranveer;
  • Mollick, Safiul Alam;
  • Mitra, Anirban;
  • Srivastava, Sanjeev Kumar;
  • Luong, Minh Anh;
  • Som, Tapobrata
  • 2021-09-28
  • ACS Applied Electronic Materials, Vol.3, pp.3804-3814
  • American Chemical Society
컴퓨터의 하드디스크 부팅속도 비교평가
  • 이세진
  • 2008-08
  • The Graduate School, Ajou University
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