Ajou University repository

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Showing results 1 to 10 of 1084 (Search time: 0.0 seconds).

Adaptive Momentum-Based Loss Rebalancing for Monocular Depth Estimationoa mark
  • 2023-01-01
  • IEEE Access, Vol.11, pp.115150-115160
  • Institute of Electrical and Electronics Engineers Inc.
Ultra-compact integrated terahertz modulator based on a graphene metasurface
  • 2021-02-01
  • Optics Letters, Vol.46, pp.605-608
  • The Optical Society
Autoencoder for Stable Embedding
  • 김재현
  • 2022-08
  • The Graduate School, Ajou University
Analysis of Short-Term Prestress Losses in Post-tensioned Structures Using Smart Strandsoa mark
  • 2022-12-01
  • International Journal of Concrete Structures and Materials, Vol.16
  • Springer
Interpreting Geostationary Environment Monitoring Spectrometer (GEMS) geostationary satellite observations of the diurnal variation in nitrogen dioxide (NO2) over East Asiaoa mark
  • Yang, Laura Hyesung;
  • Jacob, Daniel J.;
  • Dang, Ruijun;
  • Oak, Yujin J.;
  • Lin, Haipeng;
  • Kim, Jhoon;
  • Zhai, Shixian;
  • Colombi, Nadia K.;
  • Pendergrass, Drew C.;
  • Beaudry, Ellie;
  • Shah, Viral;
  • Feng, Xu;
  • Yantosca, Robert M.;
  • Chong, Heesung;
  • Park, Junsung;
  • Lee, Hanlim;
  • Lee, Won Jin;
  • Kim, Soontae;
  • Kim, Eunhye;
  • Travis, Katherine R.;
  • Crawford, James H.;
  • Liao, Hong
  • 2024-06-18
  • Atmospheric Chemistry and Physics, Vol.24, pp.7027-7039
  • Copernicus Publications
Junction Temperature Estimation of Direct-Drive GaN HEMTs in Two-Level Inverters for Driving PMSM Through Power Loss Analysis
  • 2024-05-01
  • Journal of Electrical Engineering and Technology, Vol.19, pp.2205-2216
  • Korean Institute of Electrical Engineers
Junction Temperature Estimation of SiC MOSFETs in Three-Level NPC Inverters
  • 2024-03-01
  • Journal of Electrical Engineering and Technology, Vol.19, pp.1607-1617
  • Korean Institute of Electrical Engineers
Lyapunov Optimization-Based Online Positioning in UAV-Assisted Emergency Communicationsoa mark
  • 2023-01-01
  • IEEE Access, Vol.11, pp.60835-60843
  • Institute of Electrical and Electronics Engineers Inc.
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