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Showing results 1 to 10 of 1503 (Search time: 0.0 seconds).

Quasi-localization and Wannier obstruction in partially flat bandsoa mark
  • 2024-12-01
  • Communications Physics, Vol.7
  • Nature Research
Atomically Thin Two-Dimensional Kagome Flat Band on the Silicon Surfaceoa mark
  • Lee, Jae Hyuck;
  • Kim, Gwan Woo;
  • Song, Inkyung;
  • Kim, Yejin;
  • Lee, Yeonjae;
  • Yoo, Sung Jong;
  • Cho, Deok Yong;
  • Rhim, Jun Won;
  • Jung, Jongkeun;
  • Kim, Gunn;
  • Kim, Changyoung
  • 2024-09-17
  • ACS Nano, Vol.18, pp.25535-25541
  • American Chemical Society
Analysis of Radome Cross Section of an Aircraft Equipped With a FSS Radomeoa mark
  • 2022-01-01
  • IEEE Access, Vol.10, pp.33704-33712
  • Institute of Electrical and Electronics Engineers Inc.
Electro-chemical oxidation and reduction of Ag as preparation for a high-efficiency surface enhanced Raman scattering (SERS) substrate
  • Lee, Jaeyeong;
  • Hyun, Saebyul;
  • Choi, Kyoung Soon;
  • Jeon, Cheolho;
  • Yu, Hak Ki
  • 2019-01-01
  • Journal of the Electrochemical Society, Vol.166, pp.B594-B597
  • Electrochemical Society Inc.
Troponin aptamer on an atomically flat au nanoplate platform for detection of cardiac troponin ioa mark
  • Lee, Hyoban;
  • Youn, Hyungjun;
  • Hwang, Ahreum;
  • Lee, Hyunsoo;
  • Park, Jeong Young;
  • Kim, Weon;
  • Yoo, Youngdong;
  • Ban, Changill;
  • Kang, Taejoon;
  • Kim, Bongsoo
  • 2020-07-01
  • Nanomaterials, Vol.10, pp.1-10
  • MDPI AG
Dry Sliding Wear Behavior of Sn and NiSn Overlays on Cu Connectors
  • 2018-12-01
  • Tribology Letters, Vol.66
  • Springer New York LLC
Singular flat bandsoa mark
  • 2021-01-01
  • Advances in Physics: X, Vol.6
  • Taylor and Francis Ltd.
Secondary electron emission properties of Zn-doped MgO thin films grown via electron-beam evaporation
  • 2018-05-01
  • Thin Solid Films, Vol.653, pp.57-61
  • Elsevier B.V.
Effects of materials and microstructures on pool boiling of saturated water from metallic surfaces
  • Godinez, Juan C.;
  • Cho, Hanlyun;
  • Fadda, Dani;
  • Lee, Jungho;
  • Park, Seong Jin;
  • You, Seung M.
  • 2021-07-01
  • International Journal of Thermal Sciences, Vol.165
  • Elsevier Masson s.r.l.
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