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to 10 of 2142 (Search time: 0.0 seconds).
Toward Advanced High-k and Electrode Thin Films for DRAM Capacitors via Atomic Layer Deposition
Kim, Se Eun;
Sung, Ju Young;
Jeon, Jae Deock;
Jang, Seo Young;
Lee, Hye Min;
Moon, Sang Mo;
Kang, Jun Goo;
Lim, Han Jin;
Jung, Hyung Suk;
Lee, Sang Woon
2023-10-24
Advanced Materials Technologies, Vol.8
John Wiley and Sons Inc
Atomic layer deposition of high-k and metal thin films for high-performance DRAM capacitors: A brief review
Kim, Se Eun;
Sung, Ju Young;
Yun, Yewon;
Jeon, Byeongjun;
Moon, Sang Mo;
Lee, Han Bin;
Lee, Chae Hyun;
Jung, Hae Jun;
Lee, Jae Ung
;
Lee, Sang Woon
2024-08-01
Current Applied Physics, Vol.64, pp.8-15
Elsevier B.V.
Interfacial engineering of ZrO2 metal-insulator-metal capacitor using Al2O3/TiO2 buffer layer for improved leakage properties
oa mark
Shin, Heecheol;
Choi, Hyobin;
Lim, Jaeseong;
Lee, Wanggon;
Mohit, Kumar
;
Kim, Younsoo;
Jung, Hyung Suk;
Lim, Hanjin;
Seo, Hyungtak
2022-01-01
Journal of Asian Ceramic Societies, Vol.10, pp.649-659
Taylor and Francis Ltd.
Study of Metal–Dielectric Interface for Improving Electrical Properties and Reliability of DRAM Capacitor
Lim, Han Jin;
Choi, Jae Hyoung;
Cho, Gihee;
Chang, Jaewan;
Kim, Younsoo;
Jung, Hyung Suk;
Shin, Kyoung Sub;
Seo, Hyungtak
;
Jeon, Hyeongtag
2023-10-24
Advanced Materials Technologies, Vol.8
John Wiley and Sons Inc
Alternative surface reaction route in the atomic layer deposition of NbN thin films for reduced resistivity
Lee, Hyeok Jae;
Jang, Seo Young;
Lee, Hye Min;
Sung, Ju Young;
Kim, Se Eun;
Jeon, Jae Deock;
Yun, Yewon;
Lee, Sang Woon
2023-08-15
Journal of Alloys and Compounds, Vol.952
Elsevier Ltd
Alternative Surface Reaction Route in the Atomic Layer Deposition of Titanium Nitride Thin Films for Electrode Applications
Lee, Hyeok Jae;
Hwang, Jin Ha;
Park, Ji Yong
;
Lee, Sang Woon
2021-02-23
ACS Applied Electronic Materials, Vol.3, pp.999-1005
American Chemical Society
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Lee, Kyo-Beum
84
SEO, HYUNGTAK
47
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34
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28
Chung, Tae-Sun
26
Jung, Soyi
20
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18
Kim, Jae-Hyun
18
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17
Koh, Jesung
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279
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IEEE Access
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IEEE Transactions on Power Electr...
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