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Showing results 1 to 10 of 991 (Search time: 0.0 seconds).

Bias-stress-stable sub-1.5V oxide thin-film transistors via synergistic composition of sol-gel quaternary high-k oxide dielectricsoa mark
  • Baek, Seokhyeon;
  • Choi, Jun Gyu;
  • Lee, Won June;
  • Kwak, Taehyun;
  • Jo, Yong Ryun;
  • Park, Sungjun
  • 2024-08-05
  • Journal of Alloys and Compounds, Vol.994
  • Elsevier Ltd
Dielectric properties of lead zirconate titanate/Au composite film prepared by aerosol deposition
  • Dong, Xue;
  • Lee, Bom;
  • Ghulam, Asghar;
  • Akedo, Jun;
  • Yu, Hak Ki;
  • Choi, Jae Young;
  • Park, Jae Hyuk
  • 2022-05-15
  • Materials Chemistry and Physics, Vol.284
  • Elsevier Ltd
Study of Metal–Dielectric Interface for Improving Electrical Properties and Reliability of DRAM Capacitor
  • Lim, Han Jin;
  • Choi, Jae Hyoung;
  • Cho, Gihee;
  • Chang, Jaewan;
  • Kim, Younsoo;
  • Jung, Hyung Suk;
  • Shin, Kyoung Sub;
  • Seo, Hyungtak;
  • Jeon, Hyeongtag
  • 2023-10-24
  • Advanced Materials Technologies, Vol.8
  • John Wiley and Sons Inc
Rapid and Reliable Formation of Highly Densified Bilayer Oxide Dielectrics on Silicon Substrates via DUV Photoactivation for Low-Voltage Solution-Processed Oxide Thin-Film Transistors
  • Lee, Won June;
  • Choi, Jun Gyu;
  • Sung, Sujin;
  • Kim, Chang Hyun;
  • Na, Sekwon;
  • Joo, Young Chang;
  • Park, Sungjun;
  • Yoon, Myung Han
  • 2021-01-20
  • ACS Applied Materials and Interfaces, Vol.13, pp.2820-2828
  • American Chemical Society
Leakage current suppression in spatially controlled Si-doped ZrO2 for capacitors using atomic layer deposition
  • Lee, Kunyoung;
  • Jang, Woochool;
  • Kim, Hyunjung;
  • Lim, Heewoo;
  • Kim, Bumsik;
  • Seo, Hyungtak;
  • Jeon, Hyeongtag
  • 2018-07-01
  • Thin Solid Films, Vol.657, pp.1-7
  • Elsevier B.V.
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