Ajou University repository

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Showing results 1 to 10 of 1592 (Search time: 0.0 seconds).

Fault diagnosis of open-switch failure in a grid-connected three-level Si/Sic hybrid ANPC inverteroa mark
  • 2020-03-01
  • Electronics (Switzerland), Vol.9
  • MDPI AG
모바일 디바이스를 이용한 환자 맞춤형 이미지 기반 황달 진단
  • 최성빈
  • 2018-08
  • The Graduate School, Ajou University
An Efficient Scan Diagnosis for Intermittent Faults using CNN with Multi-Channel Dataoa mark
  • Yun, Hyojoon;
  • Lim, Hyeonchan;
  • Lee, Hayoung;
  • Yoon, Doohyun;
  • Kang, Sungho
  • 2024-01-01
  • IEEE Access
  • Institute of Electrical and Electronics Engineers Inc.
Deep Retinal Fundus Image-Based Alzheimer’s Disease Diagnosis Network for Mobile Devices
  • 김도영
  • 2023-02
  • The Graduate School, Ajou University
Systematic review on human skin-compatible wearable photoplethysmography sensorsoa mark
  • Lee, Inho;
  • Park, Nakkyun;
  • Lee, Hanbee;
  • Hwang, Chuljin;
  • Kim, Joo Hee;
  • Park, Sungjun
  • 2021-03-01
  • Applied Sciences (Switzerland), Vol.11, pp.1-21
  • MDPI AG
Instrumentation-free semiquantitative immunoanalysis using a specially patterned lateral flow assay deviceoa mark
  • Lee, Kyung Won;
  • Yu, Ye Chan;
  • Chun, Hyeong Jin;
  • Jang, Yo Han;
  • Han, Yong Duk;
  • Yoon, Hyun C.
  • 2020-07-01
  • Biosensors, Vol.10
  • MDPI
Ultraflexible Vertical Corbino Organic Electrochemical Transistors for Epidermal Signal Monitoringoa mark
  • Lee, Inho;
  • Kim, Ji Hwan;
  • Kim, Youngseok;
  • Shin, Dongjoon;
  • Lee, Hyeongbeom;
  • Won, Jonghyun;
  • Kang, Keehoon;
  • Choi, Jun Gyu;
  • Yoon, Myung Han;
  • Park, Sungjun
  • 2025-01-29
  • Advanced Materials, Vol.37
  • John Wiley and Sons Inc
Reflectivity measurement of a silicon carbide mirror sample for ITER divertor vacuum ultraviolet spectrometer
  • Kim, Yoo Kwan;
  • Seon, Changrae;
  • An, Younghwa;
  • Hong, Joohwan;
  • Cheon, Munseong;
  • Kim, Boseong;
  • Kim, Yu Kwon
  • 2024-08-01
  • Review of Scientific Instruments, Vol.95
  • American Institute of Physics
One-dimensional van der Waals material SbPS4 with large bandgap for UV sensing applications
  • Cho, Sooheon;
  • Zhang, Xiaojie;
  • Lee, Bom;
  • Kang, Jinsu;
  • Jeong, Byung Joo;
  • Kim, Dahoon;
  • Kim, Yeong Hyeop;
  • Park, Jae Hyuk;
  • Kim, Sang Hyuk;
  • Yu, Hak Ki;
  • Choi, Jae Young
  • 2024-10-01
  • Sensors and Actuators A: Physical, Vol.376
  • Elsevier B.V.
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