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to 10 of 2481 (Search time: 0.0 seconds).
AI-enabled device digital forensics for smart cities
Kim, Sungbum;
Jo, Wooyeon;
Lee, Jino;
Shon, Taeshik
2022-02-01
Journal of Supercomputing, Vol.78, pp.3029-3044
Springer
Computation offloading technique for energy efficiency of smart devices
oa mark
Ko, Jaejun;
Choi, Young June
;
Paul, Rajib
2021-12-01
Journal of Cloud Computing, Vol.10
Springer Science and Business Media Deutschland GmbH
Optimal Advertisement Interval To Minimize Scanning Time of BLE Devices for IoT Services
SHAN GAOYANG
2016-08
The Graduate School, Ajou University
Empowering Storage Systems Research with NVMeVirt: A Comprehensive NVMe Device Emulator
Kim, Sang Hoon
;
Shim, Jaehoon;
Lee, Euidong;
Jeong, Seongyeop;
Kang, Ilkueon;
Kim, Jin Soo
2023-10-31
ACM Transactions on Storage, Vol.19
Association for Computing Machinery
System hardening and security monitoring for IoT devices to mitigate IoT security vulnerabilities and threats
Choi, Seul Ki;
Yang, Chung Huang;
Kwak, Jin
2018-02-28
KSII Transactions on Internet and Information Systems, Vol.12, pp.906-918
Korean Society for Internet Information
Maximized Effective Transmission Rate Model for Advanced Neighbor Discovery Process in Bluetooth Low Energy 5.0
Shan, Gaoyang
;
Roh, Byeong Hee
2022-09-01
IEEE Internet of Things Journal, Vol.9, pp.16272-16283
Institute of Electrical and Electronics Engineers Inc.
Digital Forensics for E-IoT Devices in Smart Cities
oa mark
Kim, Minju;
Shon, Taeshik
2023-08-01
Electronics (Switzerland), Vol.12
Multidisciplinary Digital Publishing Institute (MDPI)
Digital Forensics for Analyzing Cyber Threats in the XR Technology Ecosystem within Digital Twins
oa mark
Oh, Subin;
Shon, Taeshik
2024-07-01
Electronics (Switzerland), Vol.13
Multidisciplinary Digital Publishing Institute (MDPI)
A Hybrid and Lightweight Device-to-Server Authentication Technique for the Internet of Things
oa mark
Al-Otaibi, Shaha;
Khan, Rahim;
Ali, Hashim;
Khan, Aftab Ahmed;
Saeed, Amir;
Ali, Jehad
2024-01-01
Computers, Materials and Continua, Vol.78, pp.3805-3823
Tech Science Press
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